Probe #051689766c of ASUSTek G751JM

Log: smartctl

/dev/sda === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 840 EVO 1TB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EXT0BB0Q User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Oct 18 15:53:15 2015 PDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Unexpected SCT status 0x0001 (action_code=4, function_code=2) Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (15000) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 250) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 096 096 000 - 15789 12 Power_Cycle_Count -O--CK 099 099 000 - 868 177 Wear_Leveling_Count PO--C- 097 097 000 - 30 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 062 037 000 - 38 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 245 241 Total_LBAs_Written -O--CK 099 099 000 - 75579758263 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 16 Device vendor specific log 0xce GPL,SL VS 16 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) SCT Support Level: 1 Device State: Active (0) Current Temperature: 38 Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: ?/ ? Celsius Under/Over Temperature Limit Count: 0/87557 SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: ?/ ? Celsius Min/Max Temperature Limit: ?/ ? Celsius Temperature History Size (Index): 128 (1) Index Estimated Time Temperature Celsius 2 2015-10-17 18:40 ? - ... ..(125 skipped). .. - 0 2015-10-18 15:40 ? - 1 2015-10-18 15:50 38 ******************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/sdb === START OF INFORMATION SECTION === Device Model: HGST HTS541075A9E680 Serial Number: -- LU WWN Device Id: 5 000cca ... Firmware Version: JA2OA560 User Capacity: 750,156,374,016 bytes [750 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Oct 18 15:53:15 2015 PDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 45) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 167) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 062 - 0 2 Throughput_Performance P-S--- 198 198 040 - 122 3 Spin_Up_Time POS--- 253 253 033 - 1 4 Start_Stop_Count -O--C- 099 099 000 - 1730 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 7 Seek_Error_Rate PO-R-- 100 100 067 - 0 8 Seek_Time_Performance P-S--- 117 117 040 - 33 9 Power_On_Hours -O--C- 062 062 000 - 17068 10 Spin_Retry_Count PO--C- 100 100 060 - 0 12 Power_Cycle_Count -O--CK 100 100 000 - 1023 191 G-Sense_Error_Rate -O-R-- 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 100 100 000 - 3145842 193 Load_Cycle_Count -O--C- 094 094 000 - 61619 194 Temperature_Celsius -O---- 171 171 000 - 35 (Min/Max 19/55) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_Sector -O---K 100 100 000 - 0 198 Offline_Uncorrectable ---R-- 100 100 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0 223 Load_Retry_Count -O-R-- 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: 35 Celsius Power Cycle Min/Max Temperature: 35/36 Celsius Lifetime Min/Max Temperature: 19/55 Celsius Lifetime Average Temperature: 35 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -40/65 Celsius Temperature History Size (Index): 128 (52) Index Estimated Time Temperature Celsius 53 2015-10-18 13:46 37 ****************** ... ..( 6 skipped). .. ****************** 60 2015-10-18 13:53 37 ****************** 61 2015-10-18 13:54 38 ******************* ... ..( 27 skipped). .. ******************* 89 2015-10-18 14:22 38 ******************* 90 2015-10-18 14:23 39 ******************** ... ..( 2 skipped). .. ******************** 93 2015-10-18 14:26 39 ******************** 94 2015-10-18 14:27 38 ******************* ... ..( 4 skipped). .. ******************* 99 2015-10-18 14:32 38 ******************* 100 2015-10-18 14:33 37 ****************** ... ..( 8 skipped). .. ****************** 109 2015-10-18 14:42 37 ****************** 110 2015-10-18 14:43 36 ***************** 111 2015-10-18 14:44 37 ****************** 112 2015-10-18 14:45 36 ***************** ... ..( 13 skipped). .. ***************** 126 2015-10-18 14:59 36 ***************** 127 2015-10-18 15:00 35 **************** ... ..( 6 skipped). .. **************** 6 2015-10-18 15:07 35 **************** 7 2015-10-18 15:08 36 ***************** 8 2015-10-18 15:09 35 **************** ... ..( 3 skipped). .. **************** 12 2015-10-18 15:13 35 **************** 13 2015-10-18 15:14 36 ***************** 14 2015-10-18 15:15 35 **************** 15 2015-10-18 15:16 35 **************** 16 2015-10-18 15:17 36 ***************** ... ..( 4 skipped). .. ***************** 21 2015-10-18 15:22 36 ***************** 22 2015-10-18 15:23 35 **************** 23 2015-10-18 15:24 36 ***************** 24 2015-10-18 15:25 36 ***************** 25 2015-10-18 15:26 35 **************** ... ..( 5 skipped). .. **************** 31 2015-10-18 15:32 35 **************** 32 2015-10-18 15:33 ? - 33 2015-10-18 15:34 35 **************** 34 2015-10-18 15:35 36 ***************** 35 2015-10-18 15:36 35 **************** 36 2015-10-18 15:37 35 **************** 37 2015-10-18 15:38 36 ***************** 38 2015-10-18 15:39 36 ***************** 39 2015-10-18 15:40 35 **************** 40 2015-10-18 15:41 35 **************** 41 2015-10-18 15:42 35 **************** 42 2015-10-18 15:43 36 ***************** 43 2015-10-18 15:44 36 ***************** 44 2015-10-18 15:45 35 **************** ... ..( 7 skipped). .. **************** 52 2015-10-18 15:53 35 **************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS


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