/dev/sda
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-42-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Phison Driven SSDs
Device Model: KINGSTON SA400S37120G
Serial Number: --
LU WWN Device Id: 5 0026b7 ...
Firmware Version: SBFK71E0
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Aug 23 23:43:27 2020 -03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (65535) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 30) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-- 099 099 000 - 1
9 Power_On_Hours -O--C- 100 100 000 - 9718
12 Power_Cycle_Count -O--C- 100 100 000 - 2225
148 Unknown_Attribute ------ 255 255 000 - 2
149 Unknown_Attribute ------ 255 255 000 - 2
167 Write_Protect_Mode -O---K 100 100 000 - 0
168 SATA_Phy_Error_Count -O--C- 100 100 000 - 0
169 Bad_Block_Rate ------ 100 100 000 - 8
170 Bad_Blk_Ct_Erl/Lat PO--C- 100 100 010 - 0/9
172 Erase_Fail_Count -O--CK 100 100 000 - 0
173 MaxAvgErase_Ct ------ 100 100 000 - 284 (Average 252)
181 Program_Fail_Count -O--C- 100 100 000 - 0
182 Erase_Fail_Count ------ 255 255 000 - 2
187 Reported_Uncorrect -O--CK 100 100 000 - 1
192 Unsafe_Shutdown_Count -O--C- 100 100 000 - 188
194 Temperature_Celsius PO---K 077 057 000 - 23 (Min/Max 12/43)
196 Reallocated_Event_Count ------ 100 100 000 - 3
199 SATA_CRC_Error_Count -O--CK 100 100 000 - 0
218 CRC_Error_Count ------ 100 100 000 - 0
231 SSD_Life_Left PO--C- 100 100 000 - 74
233 Flash_Writes_GiB PO--C- 100 100 000 - 26449
241 Lifetime_Writes_GiB -O--C- 100 100 000 - 15005
242 Lifetime_Reads_GiB -O--C- 100 100 000 - 14674
244 Average_Erase_Count ------ 100 100 000 - 252
245 Max_Erase_Count ------ 100 100 000 - 284
246 Total_Erase_Count ------ 100 100 000 - 1484040
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
Device Error Count: 1
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 [0] occurred at disk power-on lifetime: 1 hours (0 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 00 00 00 00 55 4a df e6 00
Error: UNC at LBA = 0x06554adf = 106253023
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
c8 00 00 00 00 00 00 00 55 4a df e6 00 00:00:00.000 READ DMA
c8 00 00 00 00 00 00 00 55 49 df e6 00 00:00:00.000 READ DMA
c8 00 00 00 00 00 00 00 55 48 df e6 00 00:00:00.000 READ DMA
c8 00 00 00 00 00 00 00 55 47 df e6 00 00:00:00.000 READ DMA
c8 00 00 00 00 00 00 00 55 46 df e6 00 00:00:00.000 READ DMA
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 2225 --- Lifetime Power-On Resets
0x01 0x010 4 9718 --- Power-on Hours
0x01 0x018 6 31467979724 --- Logical Sectors Written
0x01 0x028 6 30774497947 --- Logical Sectors Read
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 1 --- Number of Reported Uncorrectable Errors
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 23 --- Current Temperature
0x05 0x020 1 43 --- Highest Temperature
0x05 0x028 1 12 --- Lowest Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 25 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 5 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
/dev/sdb
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-42-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Blue
Device Model: WDC WD5000AAKX-003CA0
Serial Number: --
LU WWN Device Id: 5 0014ee ...
Firmware Version: 15.01H15
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Aug 23 23:43:27 2020 -03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 8580) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 87) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x3037) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 200 200 051 - 2
3 Spin_Up_Time POS--K 143 142 021 - 3850
4 Start_Stop_Count -O--CK 094 094 000 - 6148
5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0
7 Seek_Error_Rate -OSR-K 100 253 000 - 0
9 Power_On_Hours -O--CK 076 076 000 - 17980
10 Spin_Retry_Count -O--CK 100 100 000 - 0
11 Calibration_Retry_Count -O--CK 100 100 000 - 0
12 Power_Cycle_Count -O--CK 095 095 000 - 5470
192 Power-Off_Retract_Count -O--CK 200 200 000 - 160
193 Load_Cycle_Count -O--CK 199 199 000 - 5987
194 Temperature_Celsius -O---K 118 094 000 - 25
196 Reallocated_Event_Count -O--CK 200 200 000 - 0
197 Current_Pending_Sector -O--CK 200 200 000 - 0
198 Offline_Uncorrectable ----CK 200 200 000 - 0
199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0
200 Multi_Zone_Error_Rate ---R-- 200 200 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 5 Comprehensive SMART error log
0x03 GPL R/O 6 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0-0xa7 GPL,SL VS 16 Device vendor specific log
0xa8-0xb5 GPL,SL VS 1 Device vendor specific log
0xb6 GPL VS 1 Device vendor specific log
0xb7 GPL,SL VS 1 Device vendor specific log
0xbd GPL,SL VS 1 Device vendor specific log
0xc0 GPL,SL VS 1 Device vendor specific log
0xc1 GPL VS 24 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (6 sectors)
Device Error Count: 2
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 [1] occurred at disk power-on lifetime: 646 hours (26 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 08 00 00 00 38 77 74 40 00
Error: UNC 8 sectors at LBA = 0x00387774 = 3700596
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 00 08 00 00 00 38 77 70 40 00 03:09:20.615 READ DMA EXT
25 00 00 00 08 00 00 00 38 77 68 40 00 03:09:20.614 READ DMA EXT
25 00 00 00 08 00 00 00 38 77 60 40 00 03:09:20.614 READ DMA EXT
25 00 00 00 08 00 00 00 38 77 58 40 00 03:09:20.614 READ DMA EXT
25 00 00 00 08 00 00 00 38 77 50 40 00 03:09:20.614 READ DMA EXT
Error 1 [0] occurred at disk power-on lifetime: 646 hours (26 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 01 00 00 00 00 38 77 74 40 00
Error: UNC 256 sectors at LBA = 0x00387774 = 3700596
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 01 00 00 00 00 38 77 00 40 00 03:09:18.842 READ DMA EXT
35 00 00 00 20 00 00 1e 40 66 80 40 00 03:09:18.841 WRITE DMA EXT
35 00 00 00 20 00 00 1e 42 35 a0 40 00 03:09:18.840 WRITE DMA EXT
25 00 00 00 20 00 00 1d 8a dc e0 40 00 03:09:18.840 READ DMA EXT
35 00 00 00 18 00 00 00 38 74 a0 40 00 03:09:18.840 WRITE DMA EXT
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 258 (0x0102)
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: 15/25 Celsius
Lifetime Min/Max Temperature: 0/49 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/60 Celsius
Min/Max Temperature Limit: -41/85 Celsius
Temperature History Size (Index): 478 (340)
Index Estimated Time Temperature Celsius
341 2020-08-23 15:46 25 ******
... ..( 81 skipped). .. ******
423 2020-08-23 17:08 25 ******
424 2020-08-23 17:09 24 *****
425 2020-08-23 17:10 25 ******
426 2020-08-23 17:11 24 *****
427 2020-08-23 17:12 24 *****
428 2020-08-23 17:13 25 ******
429 2020-08-23 17:14 24 *****
... ..( 31 skipped). .. *****
461 2020-08-23 17:46 24 *****
462 2020-08-23 17:47 25 ******
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470 2020-08-23 17:55 25 ******
471 2020-08-23 17:56 24 *****
472 2020-08-23 17:57 25 ******
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39 2020-08-23 18:42 25 ******
40 2020-08-23 18:43 24 *****
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54 2020-08-23 18:57 24 *****
55 2020-08-23 18:58 25 ******
56 2020-08-23 18:59 24 *****
57 2020-08-23 19:00 24 *****
58 2020-08-23 19:01 24 *****
59 2020-08-23 19:02 25 ******
60 2020-08-23 19:03 24 *****
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63 2020-08-23 19:06 24 *****
64 2020-08-23 19:07 25 ******
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184 2020-08-23 21:07 25 ******
185 2020-08-23 21:08 23 ****
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279 2020-08-23 22:42 23 ****
280 2020-08-23 22:43 ? -
281 2020-08-23 22:44 15 -
282 2020-08-23 22:45 16 -
283 2020-08-23 22:46 17 -
284 2020-08-23 22:47 17 -
285 2020-08-23 22:48 18 -
286 2020-08-23 22:49 18 -
287 2020-08-23 22:50 19 -
288 2020-08-23 22:51 19 -
289 2020-08-23 22:52 20 *
290 2020-08-23 22:53 21 **
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294 2020-08-23 22:57 21 **
295 2020-08-23 22:58 22 ***
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303 2020-08-23 23:06 22 ***
304 2020-08-23 23:07 23 ****
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316 2020-08-23 23:19 23 ****
317 2020-08-23 23:20 24 *****
318 2020-08-23 23:21 23 ****
319 2020-08-23 23:22 24 *****
320 2020-08-23 23:23 23 ****
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335 2020-08-23 23:38 24 *****
336 2020-08-23 23:39 25 ******
337 2020-08-23 23:40 24 *****
338 2020-08-23 23:41 24 *****
339 2020-08-23 23:42 25 ******
340 2020-08-23 23:43 25 ******
SCT Error Recovery Control command not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x8000 4 22917 Vendor specific