/dev/sda === START OF INFORMATION SECTION === Model Family: Western Digital Caviar Blue (SATA) Device Model: WDC WD5000AAKS-00YGA0 Serial Number: -- LU WWN Device Id: 5 0014ee ... Firmware Version: 12.01C02 User Capacity: 500 107 862 016 bytes [500 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 2.5, 3.0 Gb/s Local Time is: Fri Sep 18 22:45:21 2015 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM level is: 254 (maximum performance), recommended: 128 APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (13200) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 154) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x303f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 200 200 051 - 0 3 Spin_Up_Time PO---- 177 175 021 - 6141 4 Start_Stop_Count -O--CK 098 098 000 - 2231 5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0 7 Seek_Error_Rate -OSR-- 100 253 051 - 0 9 Power_On_Hours -O--CK 095 095 000 - 4333 10 Spin_Retry_Count -O--C- 100 100 051 - 0 11 Calibration_Retry_Count -O--C- 100 100 051 - 0 12 Power_Cycle_Count -O--CK 098 098 000 - 2068 192 Power-Off_Retract_Count -O--CK 200 200 000 - 393 193 Load_Cycle_Count -O--CK 200 200 000 - 2242 194 Temperature_Celsius -O---K 101 089 000 - 49 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--C- 200 200 000 - 0 198 Offline_Uncorrectable ----C- 200 200 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate ---R-- 200 200 051 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 GPL R/O 6 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0-0xa7 GPL,SL VS 16 Device vendor specific log 0xa8-0xb7 GPL,SL VS 1 Device vendor specific log 0xc0 GPL,SL VS 1 Device vendor specific log 0xc1 GPL VS 12 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (6 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 258 (0x0102) SCT Support Level: 1 Device State: SMART Off-line Data Collection executing in background (4) Current Temperature: 49 Celsius Power Cycle Min/Max Temperature: 22/50 Celsius Lifetime Min/Max Temperature: 23/61 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: 1/85 Celsius Temperature History Size (Index): 128 (86) Index Estimated Time Temperature Celsius 87 2015-09-18 20:38 48 ***************************** ... ..( 31 skipped). .. ***************************** 119 2015-09-18 21:10 48 ***************************** 120 2015-09-18 21:11 49 ****************************** 121 2015-09-18 21:12 49 ****************************** 122 2015-09-18 21:13 50 ******************************* ... ..( 5 skipped). .. ******************************* 0 2015-09-18 21:19 50 ******************************* 1 2015-09-18 21:20 49 ****************************** ... ..( 83 skipped). .. ****************************** 85 2015-09-18 22:44 49 ****************************** 86 2015-09-18 22:45 48 ***************************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x8000 4 14000 Vendor specific /dev/sdb === START OF INFORMATION SECTION === Model Family: Western Digital Caviar SE Serial ATA Device Model: WDC WD2000JD-00HBB0 Serial Number: -- Firmware Version: 08.02D08 User Capacity: 200 049 647 616 bytes [200 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 (minor revision not indicated) Local Time is: Fri Sep 18 22:45:21 2015 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM level is: 254 (maximum performance), recommended: 128 APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, NOT FROZEN [SEC1] Unknown SCT Status format version 1, should be 2 or 3. Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 5778) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 75) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 200 139 051 - 0 3 Spin_Up_Time POS--- 130 114 021 - 6033 4 Start_Stop_Count -O--CK 096 096 040 - 4490 5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0 7 Seek_Error_Rate PO-R-- 200 200 051 - 0 9 Power_On_Hours -O--CK 090 090 000 - 7632 10 Spin_Retry_Count PO--C- 100 100 051 - 0 11 Calibration_Retry_Count PO--C- 100 100 051 - 0 12 Power_Cycle_Count -O--CK 096 096 000 - 4320 194 Temperature_Celsius -O---K 103 085 000 - 47 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--C- 200 197 000 - 0 198 Offline_Uncorrectable -O--C- 200 200 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 253 000 - 1 200 Multi_Zone_Error_Rate P--R-- 200 200 051 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning Read SMART Log Directory failed: scsi error aborted command ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: scsi error aborted command Read GP Log Directory failed SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 2518 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2518 occurred at disk power-on lifetime: 2810 hours (117 days + 2 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 10 eb 93 d2 e0 Error: UNC at LBA = 0x00d293eb = 13800427 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 42 00 10 de 93 d2 12 00 06:55:56.700 READ VERIFY SECTOR(S) EXT 25 00 01 1e 94 47 06 00 06:55:56.700 READ DMA EXT 25 00 01 72 e0 a9 03 00 06:55:56.700 READ DMA EXT 42 00 10 ce 93 d2 12 00 06:55:56.700 READ VERIFY SECTOR(S) EXT 25 00 01 00 00 00 00 00 06:55:56.700 READ DMA EXT Error 2517 occurred at disk power-on lifetime: 2810 hours (117 days + 2 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 10 ec 69 d2 e0 Error: UNC at LBA = 0x00d269ec = 13789676 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 42 00 10 de 69 d2 12 00 06:55:54.600 READ VERIFY SECTOR(S) EXT 42 00 10 ce 69 d2 12 00 06:55:54.600 READ VERIFY SECTOR(S) EXT 25 00 01 0f 31 b3 0c 00 06:55:54.600 READ DMA EXT 42 00 20 ee 93 d2 12 00 06:55:54.600 READ VERIFY SECTOR(S) EXT 25 00 01 1e 94 47 06 00 06:55:54.600 READ DMA EXT Error 2516 occurred at disk power-on lifetime: 2810 hours (117 days + 2 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 eb 93 d2 e0 Error: UNC at LBA = 0x00d293eb = 13800427 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 42 00 20 ce 93 d2 12 00 06:55:52.550 READ VERIFY SECTOR(S) EXT 25 00 01 00 00 00 00 00 06:55:52.550 READ DMA EXT 42 00 20 ee 69 d2 12 00 06:55:52.550 READ VERIFY SECTOR(S) EXT 25 00 01 00 00 00 00 00 06:55:52.550 READ DMA EXT 25 00 01 00 00 00 00 00 06:55:52.550 READ DMA EXT Error 2515 occurred at disk power-on lifetime: 2810 hours (117 days + 2 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 ec 69 d2 e0 Error: UNC at LBA = 0x00d269ec = 13789676 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 42 00 20 ce 69 d2 12 00 06:55:50.200 READ VERIFY SECTOR(S) EXT 42 00 40 ce 93 d2 12 00 06:55:50.200 READ VERIFY SECTOR(S) EXT 42 00 40 8e 93 d2 12 00 06:55:50.200 READ VERIFY SECTOR(S) EXT 25 00 01 0f 31 b3 0c 00 06:55:50.200 READ DMA EXT 25 00 01 1e 94 47 06 00 06:55:50.200 READ DMA EXT Error 2514 occurred at disk power-on lifetime: 2810 hours (117 days + 2 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 40 eb 93 d2 e0 Error: UNC at LBA = 0x00d293eb = 13800427 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 42 00 40 ce 93 d2 12 00 06:55:48.100 READ VERIFY SECTOR(S) EXT 42 00 40 8e 93 d2 12 00 06:55:48.100 READ VERIFY SECTOR(S) EXT 25 00 01 0f 31 b3 0c 00 06:55:48.100 READ DMA EXT 25 00 01 1e 94 47 06 00 06:55:48.100 READ DMA EXT 42 00 40 ce 69 d2 12 00 06:55:48.100 READ VERIFY SECTOR(S) EXT SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. Unknown SCT Status format version 1, should be 2 or 3. Unknown SCT Status format version 1, should be 2 or 3. SCT (Get) Error Recovery Control command failed Device Statistics (GP Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) not supported