/dev/sda === START OF INFORMATION SECTION === Model Family: Seagate Momentus 5400.4 Device Model: ST9160827AS Serial Number: -- LU WWN Device Id: 5 000c50 ... Firmware Version: 3.AAA User Capacity: 160,041,885,696 bytes [160 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 5400 rpm Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 4 SATA Version is: SATA 2.6, 1.5 Gb/s Local Time is: Mon Apr 29 12:08:02 2019 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 426) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 64) minutes. SCT capabilities: (0x0001) SCT Status supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 100 253 006 - 0 3 Spin_Up_Time PO---- 099 099 000 - 0 4 Start_Stop_Count -O--CK 097 097 020 - 3619 5 Reallocated_Sector_Ct PO--CK 099 099 036 - 40 7 Seek_Error_Rate POSR-- 084 060 030 - 242077148 9 Power_On_Hours -O--CK 080 080 000 - 18096 10 Spin_Retry_Count PO--C- 100 100 034 - 0 12 Power_Cycle_Count -O--CK 097 097 020 - 3665 187 Reported_Uncorrect -O--CK 096 096 000 - 4 189 High_Fly_Writes -O-RCK 100 100 000 - 0 190 Airflow_Temperature_Cel -O---K 062 039 045 Past 38 (Min/Max 12/61 #29) 191 G-Sense_Error_Rate -O--CK 100 100 000 - 203 192 Power-Off_Retract_Count -O--CK 099 099 000 - 3582 193 Load_Cycle_Count -O---K 092 092 000 - 17903 194 Temperature_Celsius -O-RC- 038 061 000 - 38 (0 12 0 0 0) 195 Hardware_ECC_Recovered -O--C- 082 048 000 - 22695244 197 Current_Pending_Sector ----C- 100 099 000 - 0 198 Offline_Uncorrectable -OSRCK 100 099 000 - 0 199 UDMA_CRC_Error_Count ------ 200 200 000 - 0 200 Multi_Zone_Error_Rate -O--CK 100 253 000 - 0 202 Data_Address_Mark_Errs ------ 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 SL R/O 5 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 SL R/O 1 NCQ Command Error log 0x11 SL R/O 1 SATA Phy Event Counters log 0x20 SL R/O 1 Streaming performance log [OBS-8] 0x21 SL R/O 1 Write stream error log 0x22 SL R/O 1 Read stream error log 0x23 SL R/O 1 Delayed sector log [OBS-8] 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log 0xe0 SL R/W 1 SCT Command/Status 0xe1 SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 4 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 4 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f6 03 8c e0 Error: UNC at LBA = 0x008c03f6 = 9176054 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 20 7f bc 03 8c e0 00 00:50:23.404 READ DMA EXT 25 20 7f bc 03 8c e0 00 00:50:23.403 READ DMA EXT 25 20 7f bc 03 8c e0 00 00:50:23.401 READ DMA EXT 25 20 7f bc 03 8c e0 00 00:50:23.400 READ DMA EXT 25 20 7f 3d 03 8c e0 00 00:50:23.399 READ DMA EXT Error 3 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f6 03 8c e0 Error: UNC at LBA = 0x008c03f6 = 9176054 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 20 7f bc 03 8c e0 00 00:50:23.404 READ DMA EXT 25 20 7f bc 03 8c e0 00 00:50:23.403 READ DMA EXT 25 20 7f bc 03 8c e0 00 00:50:23.401 READ DMA EXT 25 20 7f 3d 03 8c e0 00 00:50:23.400 READ DMA EXT 25 20 7f be 02 8c e0 00 00:50:23.399 READ DMA EXT Error 2 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f6 03 8c e0 Error: UNC at LBA = 0x008c03f6 = 9176054 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 20 7f bc 03 8c e0 00 00:50:23.404 READ DMA EXT 25 20 7f bc 03 8c e0 00 00:50:23.403 READ DMA EXT 25 20 7f 3d 03 8c e0 00 00:50:23.401 READ DMA EXT 25 20 7f be 02 8c e0 00 00:50:23.400 READ DMA EXT 25 20 7f 3f 02 8c e0 00 00:50:23.399 READ DMA EXT Error 1 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f6 03 8c e0 Error: UNC at LBA = 0x008c03f6 = 9176054 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 20 7f bc 03 8c e0 00 00:50:23.404 READ DMA EXT 25 20 7f 3d 03 8c e0 00 00:50:23.403 READ DMA EXT 25 20 7f be 02 8c e0 00 00:50:23.401 READ DMA EXT 25 20 7f 3f 02 8c e0 00 00:50:23.400 READ DMA EXT 25 20 7f c0 01 8c e0 00 00:50:23.399 READ DMA EXT SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 521 (0x0209) SCT Support Level: 1 Device State: Active (0) Current Temperature: 38 Celsius Power Cycle Max Temperature: 0 Celsius Lifetime Max Temperature: 0 Celsius SCT Data Table command not supported SCT Error Recovery Control command not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy 0x8002 2 0 Vendor specific 0x8003 2 0 Vendor specific 0x8004 2 0 Vendor specific