Probe #25aa634f76 of Gigabyte A320M-S2H-CF Desktop Computer (A320M-S2H)

Log: smartctl

/dev/sdb smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-42-generic] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Phison Driven SSDs Device Model: KINGSTON SA400S37120G Serial Number: -- LU WWN Device Id: 5 0026b7 ... Firmware Version: SBFK61K1 User Capacity: 120,034,123,776 bytes [120 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-3 T13/2161-D revision 4 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 1.5 Gb/s) Local Time is: Fri Jul 24 19:07:17 2020 -03 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 127 (intermediate level with standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (65535) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 30) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate -O--CK 000 100 000 - 0 9 Power_On_Hours -O--CK 100 100 000 - 4189 12 Power_Cycle_Count -O--CK 100 100 000 - 1570 148 Unknown_Attribute ------ 100 100 000 - 0 149 Unknown_Attribute ------ 100 100 000 - 0 167 Write_Protect_Mode ------ 100 100 000 - 0 168 SATA_Phy_Error_Count -O--C- 100 100 000 - 0 169 Bad_Block_Rate ------ 100 100 000 - 49 170 Bad_Blk_Ct_Erl/Lat ------ 100 100 010 - 0/109 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 MaxAvgErase_Ct ------ 100 100 000 - 56 (Average 16) 181 Program_Fail_Count -O--CK 100 100 000 - 0 182 Erase_Fail_Count ------ 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 192 Unsafe_Shutdown_Count -O--C- 100 100 000 - 1560 194 Temperature_Celsius -O---K 059 051 000 - 41 (Min/Max 19/49) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 199 SATA_CRC_Error_Count -O--CK 100 100 000 - 0 218 CRC_Error_Count -O--CK 100 100 000 - 0 231 SSD_Life_Left ------ 002 002 000 - 98 233 Flash_Writes_GiB -O--CK 100 100 000 - 1162 241 Lifetime_Writes_GiB -O--CK 100 100 000 - 1269 242 Lifetime_Reads_GiB -O--CK 100 100 000 - 1027 244 Average_Erase_Count ------ 100 100 000 - 16 245 Max_Erase_Count ------ 100 100 000 - 56 246 Total_Erase_Count ------ 100 100 000 - 174968 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron] Read GP Log Directory failed SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x04 SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x09 SL R/W 1 Selective self-test log 0x30 SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (SMART Log 0x04) Page Offset Size Value Flags Description ATA_SMART_READ_LOG failed: Multi-sector ATA commands not implemented [JMicron] Read Device Statistics pages 0x00-0x07 failed Pending Defects log (GP Log 0x0c) not supported ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron] Read SATA Phy Event Counters failed


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