/dev/sda smartctl 7.3 2022-02-28 r5338 [x86_64-linux-5.15.41-gentoo-x86_64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: HFS128G39MNC-3510A Serial Number: -- Firmware Version: 50100P00 User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: Not in smartctl database 7.3/5319 ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Jul 10 21:20:28 2022 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 60) minutes. SMART Attributes Data Structure revision number: 0 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 166 166 006 - 0 5 Reallocated_Sector_Ct -O--CK 253 253 036 - 0 9 Power_On_Hours -O--CK 095 095 000 - 4520 12 Power_Cycle_Count -O--CK 100 100 020 - 3655 100 Unknown_Attribute -O--CK 100 100 000 - 8389318 171 Unknown_Attribute -O--CK 100 100 000 - 1 172 Unknown_Attribute -O--CK 253 253 000 - 0 174 Unknown_Attribute ----CK 100 100 000 - 300 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 1 176 Erase_Fail_Count_Chip -O--CK 253 253 000 - 0 177 Wear_Leveling_Count -O--CK 092 092 000 - 257 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 3 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 14 180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 2226 181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 1 182 Erase_Fail_Count_Total -O--CK 253 253 000 - 0 183 Runtime_Bad_Block -O--CK 253 253 000 - 0 187 Reported_Uncorrect -O--CK 253 253 000 - 0 188 Command_Timeout -O--CK 253 253 000 - 0 191 Unknown_SSD_Attribute -O--CK 253 253 000 - 0 194 Temperature_Celsius -O---- 027 000 000 - 27 (Min/Max 15/66) 195 Hardware_ECC_Recovered -O--CK 253 253 000 - 0 201 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0 204 Soft_ECC_Correction -OSR-- 100 100 000 - 0 231 Unknown_SSD_Attribute PO--CK 099 099 010 - 2 234 Unknown_Attribute -O--CK 100 100 000 - 32705 241 Total_LBAs_Written -O--CK 100 100 000 - 10548 242 Total_LBAs_Read -O--CK 100 100 000 - 12848 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 14276 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 4 Comprehensive SMART error log 0x03 GPL R/O 5 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 2 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL R/O 8 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (5 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (2 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (empty) == 0x04 ===== = = === == General Errors Statistics (empty) == 0x05 ===== = = === == Temperature Statistics (empty) == 0x06 ===== = = === == Transport Statistics (empty) == 0x07 ===== = = === == Solid State Device Statistics (rev 1) == |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x000a 2 3 Device-to-host register FISes sent due to a COMRESET /dev/sdb smartctl 7.3 2022-02-28 r5338 [x86_64-linux-5.15.41-gentoo-x86_64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: WD Blue / Red / Green SSDs Device Model: WDC WDS100T2B0A-00SM50 Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: 415000WD User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5319 ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Jul 10 21:20:28 2022 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 4 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 --- - 0 9 Power_On_Hours -O--CK 100 100 --- - 1681 12 Power_Cycle_Count -O--CK 100 100 --- - 1065 165 Block_Erase_Count -O--CK 100 100 --- - 10944633 166 Minimum_PE_Cycles_TLC -O--CK 100 100 --- - 1 167 Max_Bad_Blocks_per_Die -O--CK 100 100 --- - 101 168 Maximum_PE_Cycles_TLC -O--CK 100 100 --- - 2 169 Total_Bad_Blocks -O--CK 100 100 --- - 1041 170 Grown_Bad_Blocks -O--CK 100 100 --- - 0 171 Program_Fail_Count -O--CK 100 100 --- - 0 172 Erase_Fail_Count -O--CK 100 100 --- - 0 173 Average_PE_Cycles_TLC -O--CK 100 100 --- - 1 174 Unexpected_Power_Loss -O--CK 100 100 --- - 94 184 End-to-End_Error -O--CK 100 100 --- - 0 187 Reported_Uncorrect -O--CK 100 100 --- - 0 188 Command_Timeout -O--CK 100 100 --- - 0 194 Temperature_Celsius -O---K 071 050 --- - 29 (Min/Max 18/50) 199 UDMA_CRC_Error_Count -O--CK 100 100 --- - 0 230 Media_Wearout_Indicator -O--CK 001 001 --- - 0x0018000a0018 232 Available_Reservd_Space PO--CK 100 100 004 - 100 233 NAND_GB_Written_TLC -O--CK 100 100 --- - 1547 234 NAND_GB_Written_SLC -O--CK 100 100 --- - 1810 241 Host_Writes_GiB ----CK 253 253 --- - 1695 242 Host_Reads_GiB ----CK 253 253 --- - 1058 244 Temp_Throttle_Status -O--CK 000 100 --- - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 1957 Current Device Internal Status Data log 0x25 GPL R/O 1957 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 1065 --- Lifetime Power-On Resets 0x01 0x010 4 1681 --- Power-on Hours 0x01 0x018 6 3556685992 --- Logical Sectors Written 0x01 0x020 6 22499440 --- Number of Write Commands 0x01 0x028 6 2220762747 --- Logical Sectors Read 0x01 0x030 6 38670150327 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 3 Device-to-host register FISes sent due to a COMRESET