/dev/sda === START OF INFORMATION SECTION === Device Model: SPCC Solid State Disk Serial Number: -- LU WWN Device Id: 0 000000 ... Firmware Version: VE1R900F User Capacity: 512,110,190,592 bytes [512 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu Apr 4 12:05:59 2024 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Disabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 2) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 9 12 Power_Cycle_Count -O--CK 100 100 000 - 42 161 Unknown_Attribute -O--CK 100 100 050 - 0 162 Unknown_Attribute -O--CK 100 100 000 - 173 163 Unknown_Attribute -O--CK 100 100 000 - 3000 164 Unknown_Attribute -O--CK 100 100 000 - 0 166 Unknown_Attribute -O--CK 100 100 000 - 16 167 Unknown_Attribute -O--CK 100 100 000 - 0 168 Unknown_Attribute -O--CK 100 100 000 - 0 169 Unknown_Attribute -O--CK 100 100 000 - 100 171 Unknown_Attribute -O--CK 100 100 000 - 0 172 Unknown_Attribute -O--CK 100 100 000 - 0 174 Unknown_Attribute -O--CK 100 100 000 - 3 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0 181 Program_Fail_Cnt_Total -O---K 100 100 000 - 953114 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 100 100 000 - 40 195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 206 Unknown_SSD_Attribute -O--CK 100 100 000 - 0 207 Unknown_SSD_Attribute -O--CK 100 100 000 - 1 232 Available_Reservd_Space -O--CK 100 100 000 - 100 241 Total_LBAs_Written -O--CK 100 100 000 - 374 242 Total_LBAs_Read -O--CK 100 100 000 - 166 249 Unknown_Attribute -O--CK 100 100 000 - 167 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 395 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 5 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 8 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (2 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 42 --- Lifetime Power-On Resets 0x01 0x010 4 9 --- Power-on Hours 0x01 0x018 6 785087829 --- Logical Sectors Written 0x01 0x020 6 6982069 --- Number of Write Commands 0x01 0x028 6 349211715 --- Logical Sectors Read 0x01 0x030 6 3619861 --- Number of Read Commands 0x01 0x038 6 33203801 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 127 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x000a 4 3 Device-to-host register FISes sent due to a COMRESET /dev/sdb === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint M5 Device Model: SAMSUNG HM160HI Serial Number: -- LU WWN Device Id: 5 0f0000 ... Firmware Version: HH100-08 User Capacity: 160,041,885,696 bytes [160 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 0 SATA Version is: SATA 2.5, 1.5 Gb/s Local Time is: Thu Apr 4 12:06:00 2024 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Write SCT (Get) Feature Control Command failed: scsi error medium or hardware error (serious) Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 55) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 55) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 100 100 051 - 0 3 Spin_Up_Time POS--- 252 252 025 - 2062 4 Start_Stop_Count -O--CK 094 094 000 - 6489 5 Reallocated_Sector_Ct PO--CK 070 070 010 - 288 7 Seek_Error_Rate -OSR-- 252 252 051 - 0 8 Seek_Time_Performance --S--K 252 252 015 - 0 9 Power_On_Hours -O--CK 078 078 000 - 11936 10 Spin_Retry_Count -O--CK 100 100 051 - 2 12 Power_Cycle_Count -O--CK 097 097 000 - 3090 191 G-Sense_Error_Rate -O--CK 079 079 000 - 214386 192 Power-Off_Retract_Count -O--CK 100 100 000 - 942 194 Temperature_Celsius -O---K 130 046 000 - 36 (Min/Max 8/64) 195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 1 196 Reallocated_Event_Count -O--CK 252 252 000 - 0 197 Current_Pending_Sector -O--C- 252 252 000 - 0 198 Offline_Uncorrectable ----CK 252 252 000 - 0 199 UDMA_CRC_Error_Count -OS-CK 200 200 000 - 3 200 Multi_Zone_Error_Rate -O-R-- 100 100 000 - 2 201 Soft_Read_Error_Rate -O--CK 252 252 000 - 0 223 Load_Retry_Count -O--CK 099 099 000 - 1598 225 Load_Cycle_Count -O--CK 079 079 000 - 213009 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x08 SL R/O 1 Power Conditions log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80 GPL,SL R/W 16 Host vendor specific log 0x81-0x9f SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (2 sectors) Device Error Count: 3 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 3 [2] occurred at disk power-on lifetime: 11175 hours (465 days + 15 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 08 00 00 07 ba 26 13 46 00 Error: ICRC, ABRT 8 sectors at LBA = 0x07ba2613 = 129639955 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 08 00 00 07 ba 26 13 46 00 00:31:17.562 READ DMA EXT 25 00 00 00 08 00 00 07 ba 26 0b 46 00 00:31:17.562 READ DMA EXT 25 00 00 00 08 00 00 07 ba 26 03 46 00 00:31:17.562 READ DMA EXT 25 00 00 00 08 00 00 07 ba 25 fb 46 00 00:31:17.562 READ DMA EXT 25 00 00 00 08 00 00 07 ba 25 f3 46 00 00:31:17.562 READ DMA EXT Error 2 [1] occurred at disk power-on lifetime: 11170 hours (465 days + 10 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 01 00 00 00 06 27 24 1a 43 00 Error: ICRC, ABRT 256 sectors at LBA = 0x0727241a = 120005658 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 03 03 01 00 00 00 06 27 24 1a 43 00 12:54:10.250 READ DMA EXT 25 03 03 01 00 00 00 06 27 23 1a 43 00 12:54:10.250 READ DMA EXT 25 03 03 01 00 00 00 06 27 22 1a 43 00 12:54:10.250 READ DMA EXT 25 03 03 01 00 00 00 06 27 21 1a 43 00 12:54:10.250 READ DMA EXT 25 03 03 01 00 00 00 06 27 20 1a 43 00 12:54:10.250 READ DMA EXT Error 1 [0] occurred at disk power-on lifetime: 11149 hours (464 days + 13 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 10 00 00 00 9f 63 a2 41 00 Error: ICRC, ABRT 16 sectors at LBA = 0x019f63a2 = 27222946 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 03 03 00 10 00 00 00 9f 63 a2 41 00 00:54:02.375 READ DMA EXT 25 03 03 00 08 00 00 00 9f 63 9a 41 00 00:54:02.375 READ DMA EXT 25 03 03 00 08 00 00 00 9f 63 b2 41 00 00:54:02.375 READ DMA EXT 25 03 03 00 10 00 00 00 9f 63 72 41 00 00:54:02.375 READ DMA EXT 25 03 03 00 08 00 00 00 9f 63 6a 41 00 00:54:02.375 READ DMA EXT SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 9 - # 2 Short offline Completed without error 00% 8 - # 3 Extended offline Aborted by host 80% 8 - # 4 Short offline Completed without error 00% 8 - # 5 Extended offline Interrupted (host reset) 90% 8 - # 6 Short offline Completed without error 00% 8 - # 7 Extended offline Completed without error 00% 0 - # 8 Short offline Completed without error 00% 0 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 36 Celsius Power Cycle Min/Max Temperature: 36/37 Celsius Lifetime Min/Max Temperature: 9/64 Celsius Under/Over Temperature Limit Count: 0/0 Write SCT Data Table failed: scsi error medium or hardware error (serious) Read SCT Temperature History failed Write SCT (Get) Error Recovery Control Command failed: scsi error medium or hardware error (serious) SCT (Get) Error Recovery Control command failed Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x000a 2 0 Device-to-host register FISes sent due to a COMRESET 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x8001 2 0 Vendor specific