Probe #4c6b9a3f5e of P4M800CE-8237 Desktop Computer

Log: smartctl

/dev/sda smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.14-desktop-1omv4002] (OpenMandriva Lx 7.2-2) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Quantum Fireball lct20 Device Model: QUANTUM FIREBALLlct20 30 Serial Number: -- Firmware Version: APL.0900 User Capacity: 30,020,272,128 bytes [30.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-5 T13/1321D revision 1 Local Time is: Wed Apr 6 00:07:14 2022 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 51) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 35) minutes. SMART Attributes Data Structure revision number: 11 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate P--R-K 100 253 020 - 0 3 Spin_Up_Time POS--K 079 072 020 - 2728 4 Start_Stop_Count -O--CK 089 089 008 - 7729 5 Reallocated_Sector_Ct PO--CK 100 100 020 - 0 7 Seek_Error_Rate PO-R-- 100 093 023 - 0 9 Power_On_Hours -O--C- 046 046 001 - 35467 10 Spin_Retry_Count -OS--K 100 095 000 - 0 11 Calibration_Retry_Count PO--C- 100 090 020 - 0 12 Power_Cycle_Count -O--CK 089 089 008 - 7468 13 Read_Soft_Error_Rate PO-R-- 100 100 023 - 0 195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 1008965 196 Reallocated_Event_Count ----C- 100 100 020 - 0 197 Current_Pending_Sector -O--CK 100 100 020 - 0 198 Offline_Uncorrectable ----C- 100 253 000 - 0 199 UDMA_CRC_Error_Count -O-RC- 200 196 000 - 64 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning Read SMART Log Directory failed: scsi error badly formed scsi parameters General Purpose Log Directory not supported SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 163 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 163 occurred at disk power-on lifetime: 26312 hours (1096 days + 8 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 d9 70 0e 32 e2 e0 Error: UNC 112 sectors at LBA = 0x00e2320e = 14823950 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 ff 31 e2 e0 00 49d+16:56:39.283 READ DMA ca 00 80 e7 8f 1e e1 00 49d+16:56:39.271 WRITE DMA c8 00 80 17 6e 65 e0 00 49d+16:56:39.254 READ DMA ca 00 80 67 8f 1e e1 00 49d+16:56:39.242 WRITE DMA c8 00 80 97 6d 65 e0 00 49d+16:56:39.224 READ DMA Error 162 occurred at disk power-on lifetime: 26312 hours (1096 days + 8 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 d9 70 0e 32 e2 e0 Error: UNC 112 sectors at LBA = 0x00e2320e = 14823950 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 ff 31 e2 e0 00 49d+16:55:00.871 READ DMA ca 00 80 17 6e 65 e0 00 49d+16:55:00.852 WRITE DMA c8 00 80 e7 8f 1e e1 00 49d+16:55:00.829 READ DMA ca 00 80 97 6d 65 e0 00 49d+16:55:00.806 WRITE DMA c8 00 80 67 8f 1e e1 00 49d+16:55:00.783 READ DMA Error 161 occurred at disk power-on lifetime: 26311 hours (1096 days + 7 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 d9 70 0e 32 e2 e0 Error: UNC 112 sectors at LBA = 0x00e2320e = 14823950 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 ff 31 e2 e0 00 49d+16:59:33.549 READ DMA ca 00 80 e7 8f 1e e1 00 49d+16:59:33.529 WRITE DMA c8 00 80 2f aa 64 e0 00 49d+16:59:33.506 READ DMA ca 00 80 67 8f 1e e1 00 49d+16:59:33.483 WRITE DMA c8 00 80 af a9 64 e0 00 49d+16:59:33.463 READ DMA Error 160 occurred at disk power-on lifetime: 26311 hours (1096 days + 7 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 d9 70 0e 32 e2 e0 Error: UNC 112 sectors at LBA = 0x00e2320e = 14823950 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 ff 31 e2 e0 00 49d+16:57:55.273 READ DMA ca 00 80 2f aa 64 e0 00 49d+16:57:55.251 WRITE DMA c8 00 80 e7 8f 1e e1 00 49d+16:57:55.230 READ DMA ca 00 80 af a9 64 e0 00 49d+16:57:55.218 WRITE DMA c8 00 80 67 8f 1e e1 00 49d+16:57:55.201 READ DMA Error 159 occurred at disk power-on lifetime: 26311 hours (1096 days + 7 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 d9 70 0e 32 e2 e0 Error: UNC 112 sectors at LBA = 0x00e2320e = 14823950 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 ff 31 e2 e0 00 49d+16:56:18.392 READ DMA ca 00 80 e7 8f 1e e1 00 49d+16:56:18.368 WRITE DMA c8 00 80 3f 62 66 e0 00 49d+16:56:18.350 READ DMA ca 00 80 67 8f 1e e1 00 49d+16:56:18.326 WRITE DMA c8 00 80 bf 61 66 e0 00 49d+16:56:18.307 READ DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 0 Warning: ATA Specification requires self-test log structure revision number = 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 35168 - Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported /dev/sdb smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.14-desktop-1omv4002] (OpenMandriva Lx 7.2-2) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital Caviar Device Model: WDC WD800BB-00JHC0 Serial Number: -- Firmware Version: 05.01C05 User Capacity: 80,026,361,856 bytes [80.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 (minor revision not indicated) Local Time is: Wed Apr 6 00:07:15 2022 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Unknown SCT Status format version 1, should be 2 or 3. Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 2460) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 35) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 200 200 051 - 275 3 Spin_Up_Time PO---- 164 162 021 - 2800 4 Start_Stop_Count -O--CK 095 095 000 - 5065 5 Reallocated_Sector_Ct PO--CK 197 197 140 - 24 7 Seek_Error_Rate POSR-- 200 200 051 - 0 9 Power_On_Hours -O--CK 085 085 000 - 11382 10 Spin_Retry_Count PO--C- 100 100 051 - 0 11 Calibration_Retry_Count -O--C- 100 100 051 - 0 12 Power_Cycle_Count -O--CK 096 096 000 - 4717 194 Temperature_Celsius -O---K 114 090 000 - 29 196 Reallocated_Event_Count -O--CK 190 190 000 - 10 197 Current_Pending_Sector -O--C- 200 199 000 - 0 198 Offline_Uncorrectable ----C- 200 199 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 67 200 Multi_Zone_Error_Rate P--R-- 200 200 051 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning Read SMART Log Directory failed: scsi error badly formed scsi parameters General Purpose Log Directory not supported SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 281 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 281 occurred at disk power-on lifetime: 9652 hours (402 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 c3 c7 bf e0 Error: UNC 1 sectors at LBA = 0x00bfc7c3 = 12568515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 c3 c7 bf 00 58 00:48:06.960 READ DMA f8 00 00 00 00 00 00 58 00:48:06.935 READ NATIVE MAX ADDRESS [OBS-ACS-3] ec 00 00 00 00 00 00 58 00:48:06.930 IDENTIFY DEVICE ef 03 45 00 00 00 00 58 00:48:06.930 SET FEATURES [Set transfer mode] f8 00 00 00 00 00 00 58 00:48:06.930 READ NATIVE MAX ADDRESS [OBS-ACS-3] Error 280 occurred at disk power-on lifetime: 9652 hours (402 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 c3 c7 bf e0 Error: UNC 1 sectors at LBA = 0x00bfc7c3 = 12568515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 c3 c7 bf 00 58 00:48:04.990 READ DMA f8 00 00 00 00 00 00 58 00:48:04.965 READ NATIVE MAX ADDRESS [OBS-ACS-3] ec 00 00 00 00 00 00 58 00:48:04.960 IDENTIFY DEVICE ef 03 45 00 00 00 00 58 00:48:04.960 SET FEATURES [Set transfer mode] f8 00 00 00 00 00 00 58 00:48:04.960 READ NATIVE MAX ADDRESS [OBS-ACS-3] Error 279 occurred at disk power-on lifetime: 9652 hours (402 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 c3 c7 bf e0 Error: UNC 1 sectors at LBA = 0x00bfc7c3 = 12568515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 c3 c7 bf 00 58 00:48:03.025 READ DMA c8 00 07 38 6d 5a 03 58 00:48:02.970 READ DMA c8 00 01 37 6d 5a 03 58 00:48:02.970 READ DMA c8 00 07 30 6d 5a 03 58 00:48:02.970 READ DMA c8 00 01 2f 6d 5a 03 58 00:48:02.970 READ DMA Error 278 occurred at disk power-on lifetime: 9652 hours (402 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 c3 c7 bf e0 Error: UNC 1 sectors at LBA = 0x00bfc7c3 = 12568515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 c3 c7 bf 00 58 00:48:00.600 READ DMA c8 00 03 c4 c7 bf 00 58 00:48:00.585 READ DMA f8 00 00 00 00 00 00 58 00:48:00.560 READ NATIVE MAX ADDRESS [OBS-ACS-3] ec 00 00 00 00 00 00 58 00:48:00.555 IDENTIFY DEVICE ef 03 45 00 00 00 00 58 00:48:00.555 SET FEATURES [Set transfer mode] Error 277 occurred at disk power-on lifetime: 9652 hours (402 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 c3 c7 bf e0 Error: UNC 1 sectors at LBA = 0x00bfc7c3 = 12568515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 c3 c7 bf 00 58 00:47:58.625 READ DMA c8 00 07 c8 c7 bf 00 58 00:47:58.625 READ DMA c8 00 01 c7 c7 bf 00 58 00:47:58.615 READ DMA f8 00 00 00 00 00 00 58 00:47:58.595 READ NATIVE MAX ADDRESS [OBS-ACS-3] ec 00 00 00 00 00 00 58 00:47:58.590 IDENTIFY DEVICE SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 11082 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. Unknown SCT Status format version 1, should be 2 or 3. Unknown SCT Status format version 1, should be 2 or 3. SCT (Get) Error Recovery Control command failed Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported


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