Probe #4df1fcb20c of Dell Latitude E5550

Log: smartctl

/dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.6-200.fc41.x86_64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SK hynix SATA SSDs Device Model: SK hynix SC300 2.5 7MM 256GB Serial Number: -- Firmware Version: 20100P00 User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5528 ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Dec 31 15:16:29 2024 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 2) seconds. Offline data collection capabilities: (0x19) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 60) minutes. SMART Attributes Data Structure revision number: 0 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 166 166 006 - 0 5 Retired_Block_Count -O--CK 253 253 036 - 0 9 Power_On_Hours -O--CK 098 098 000 - 2548 12 Power_Cycle_Count -O--CK 100 100 020 - 1283 100 Total_Erase_Count -O--CK 100 100 000 - 4037565 171 Program_Fail_Count -O--CK 253 253 000 - 0 172 Erase_Fail_Count -O--CK 253 253 000 - 0 174 Unexpect_Power_Loss_Ct ----CK 100 100 000 - 42 175 Program_Fail_Count_Chip -O--CK 253 253 000 - 0 176 Unused_Rsvd_Blk_Cnt_Tot -O--CK 253 253 000 - 0 177 Wear_Leveling_Count -O--CK 099 099 000 - 59 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 32 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 125 180 Erase_Fail_Count -O--CK 100 100 000 - 4163 181 Non4k_Aligned_Access -O--CK 253 253 000 - 0 182 Erase_Fail_Count_Total -O--CK 253 253 000 - 0 183 SATA_Downshift_Count -O--CK 253 253 000 - 0 187 Reported_Uncorrect -O--CK 253 253 000 - 0 188 Command_Timeout -O--CK 253 253 000 - 0 191 Unknown_SK_hynix_Attrib -O--CK 253 253 000 - 0 194 Temperature_Celsius -O---- 032 000 000 - 32 (Min/Max 0/60) 195 Hardware_ECC_Recovered -O--CK 253 253 000 - 0 201 Percent_Lifetime_Remain -OSR-- 100 100 000 - 0 204 Soft_ECC_Correction -OSR-- 100 100 000 - 0 231 SSD_Life_Left PO--CK 253 253 010 - 0 234 Unknown_SK_hynix_Attrib -O--CK 100 100 000 - 15251 241 Total_Writes_GB -O--CK 100 100 000 - 7292 242 Total_Reads_GB -O--CK 100 100 000 - 9886 250 Read_Retry_Count -O--CK 100 100 000 - 485 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 4 Comprehensive SMART error log 0x03 GPL R/O 5 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 2 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL R/O 2 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (5 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (2 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 1 - Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (empty) == 0x04 ===== = = === == General Errors Statistics (empty) == 0x05 ===== = = === == Temperature Statistics (empty) == 0x06 ===== = = === == Transport Statistics (empty) == 0x07 ===== = = === == Solid State Device Statistics (empty) == |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x000a 2 29 Device-to-host register FISes sent due to a COMRESET


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