Probe #54b77ba07a of Dell Latitude E6530

Log: smartctl

/dev/sda === START OF INFORMATION SECTION === Model Family: HGST Travelstar 7K1000 Device Model: HGST HTS721010A9E630 Serial Number: -- LU WWN Device Id: 5 000cca ... Firmware Version: JB0OA3J0 User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 7200 rpm Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Nov 12 16:01:42 2017 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 45) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 171) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 062 - 0 2 Throughput_Performance P-S--- 162 162 040 - 94 3 Spin_Up_Time POS--- 123 123 033 - 2 4 Start_Stop_Count -O--C- 100 100 000 - 1400 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 7 Seek_Error_Rate PO-R-- 100 100 067 - 0 8 Seek_Time_Performance P-S--- 140 140 040 - 33 9 Power_On_Hours -O--C- 090 090 000 - 4381 10 Spin_Retry_Count PO--C- 100 100 060 - 0 12 Power_Cycle_Count -O--CK 100 100 000 - 1396 191 G-Sense_Error_Rate -O-R-- 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 100 100 000 - 40 193 Load_Cycle_Count -O--C- 088 088 000 - 124753 194 Temperature_Celsius -O---- 240 240 000 - 25 (Min/Max 9/52) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_Sector -O---K 100 100 000 - 0 198 Offline_Uncorrectable ---R-- 100 100 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 18 223 Load_Retry_Count -O-R-- 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 18 (device log contains only the most recent 4 errors) CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 18 [1] occurred at disk power-on lifetime: 2397 hours (99 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 01 00 00 00 00 08 07 00 00 Error: ICRC, ABRT at LBA = 0x00000807 = 2055 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 61 00 08 00 b0 00 00 00 00 08 00 40 00 00:00:10.266 WRITE FPDMA QUEUED ef 00 10 00 02 00 00 00 00 00 00 a0 00 00:00:10.265 SET FEATURES [Enable SATA feature] 27 00 00 00 00 00 00 00 00 00 00 e0 00 00:00:10.265 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3] ec 00 00 00 00 00 00 00 00 00 00 a0 00 00:00:10.264 IDENTIFY DEVICE ef 00 03 00 46 00 00 00 00 00 00 a0 00 00:00:10.264 SET FEATURES [Set transfer mode] Error 17 [0] occurred at disk power-on lifetime: 2397 hours (99 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 01 00 00 00 00 08 07 00 00 Error: ICRC, ABRT at LBA = 0x00000807 = 2055 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 61 00 08 00 a8 00 00 00 00 08 00 40 00 00:00:09.908 WRITE FPDMA QUEUED ef 00 10 00 02 00 00 00 00 00 00 a0 00 00:00:09.908 SET FEATURES [Enable SATA feature] 27 00 00 00 00 00 00 00 00 00 00 e0 00 00:00:09.908 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3] ec 00 00 00 00 00 00 00 00 00 00 a0 00 00:00:09.907 IDENTIFY DEVICE ef 00 03 00 46 00 00 00 00 00 00 a0 00 00:00:09.906 SET FEATURES [Set transfer mode] Error 16 [3] occurred at disk power-on lifetime: 2397 hours (99 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 01 00 00 00 00 08 07 00 00 Error: ICRC, ABRT at LBA = 0x00000807 = 2055 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 61 00 08 00 a0 00 00 00 00 08 00 40 00 00:00:09.589 WRITE FPDMA QUEUED ef 00 10 00 02 00 00 00 00 00 00 a0 00 00:00:09.589 SET FEATURES [Enable SATA feature] 27 00 00 00 00 00 00 00 00 00 00 e0 00 00:00:09.588 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3] ec 00 00 00 00 00 00 00 00 00 00 a0 00 00:00:09.587 IDENTIFY DEVICE ef 00 03 00 46 00 00 00 00 00 00 a0 00 00:00:09.587 SET FEATURES [Set transfer mode] Error 15 [2] occurred at disk power-on lifetime: 2397 hours (99 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 01 00 00 00 00 08 07 00 00 Error: ICRC, ABRT at LBA = 0x00000807 = 2055 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 61 00 08 00 98 00 00 00 00 08 00 40 00 00:00:09.271 WRITE FPDMA QUEUED ea 00 00 00 00 00 00 00 00 00 00 a0 00 00:00:09.245 FLUSH CACHE EXT 61 00 08 00 88 00 00 01 04 08 00 40 00 00:00:09.245 WRITE FPDMA QUEUED 60 00 08 00 80 00 00 00 04 08 00 40 00 00:00:09.238 READ FPDMA QUEUED 60 00 08 00 78 00 00 01 04 08 00 40 00 00:00:09.227 READ FPDMA QUEUED SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: 25 Celsius Power Cycle Min/Max Temperature: 22/25 Celsius Lifetime Min/Max Temperature: 9/52 Celsius Lifetime Average Temperature: 37 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -40/65 Celsius Temperature History Size (Index): 128 (63) Index Estimated Time Temperature Celsius 64 2017-11-12 13:54 38 ******************* 65 2017-11-12 13:55 38 ******************* 66 2017-11-12 13:56 37 ****************** ... ..( 2 skipped). .. ****************** 69 2017-11-12 13:59 37 ****************** 70 2017-11-12 14:00 36 ***************** ... ..( 9 skipped). .. ***************** 80 2017-11-12 14:10 36 ***************** 81 2017-11-12 14:11 35 **************** 82 2017-11-12 14:12 36 ***************** ... ..( 20 skipped). .. ***************** 103 2017-11-12 14:33 36 ***************** 104 2017-11-12 14:34 37 ****************** 105 2017-11-12 14:35 37 ****************** 106 2017-11-12 14:36 37 ****************** 107 2017-11-12 14:37 36 ***************** ... ..( 45 skipped). .. ***************** 25 2017-11-12 15:23 36 ***************** 26 2017-11-12 15:24 35 **************** 27 2017-11-12 15:25 36 ***************** 28 2017-11-12 15:26 35 **************** 29 2017-11-12 15:27 36 ***************** 30 2017-11-12 15:28 36 ***************** 31 2017-11-12 15:29 35 **************** 32 2017-11-12 15:30 36 ***************** 33 2017-11-12 15:31 35 **************** ... ..( 3 skipped). .. **************** 37 2017-11-12 15:35 35 **************** 38 2017-11-12 15:36 36 ***************** 39 2017-11-12 15:37 36 ***************** 40 2017-11-12 15:38 35 **************** 41 2017-11-12 15:39 36 ***************** ... ..( 13 skipped). .. ***************** 55 2017-11-12 15:53 36 ***************** 56 2017-11-12 15:54 37 ****************** 57 2017-11-12 15:55 36 ***************** 58 2017-11-12 15:56 37 ****************** 59 2017-11-12 15:57 37 ****************** 60 2017-11-12 15:58 37 ****************** 61 2017-11-12 15:59 ? - 62 2017-11-12 16:00 23 **** 63 2017-11-12 16:01 25 ****** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS /dev/sdb === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 850 EVO 250GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EMT03B6Q User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Nov 12 16:01:43 2017 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 133) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 2 177 Wear_Leveling_Count PO--C- 100 100 000 - 0 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 071 068 000 - 29 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 100 100 000 - 0 241 Total_LBAs_Written -O--CK 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: ? Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: 40/40 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (10) Index Estimated Time Temperature Celsius 11 2017-11-11 18:50 ? - ... ..(115 skipped). .. - 127 2017-11-12 14:10 ? - 0 2017-11-12 14:20 40 ********************* 1 2017-11-12 14:30 ? - ... ..( 8 skipped). .. - 10 2017-11-12 16:00 ? - SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 6 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 6 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC


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