Probe #75b181e2f3 of DEXP M14-I5W304

Log: smartctl

/dev/nvme0n1 smartctl 7.5 2025-04-30 r5714 [x86_64-linux-6.15.9-arch1-1] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: BIWIN NA80Y1M10-512G Serial Number: -- Firmware Version: SN11795 PCI Vendor/Subsystem ID: 0x1e4b IEEE OUI Identifier: 0x000000 Total NVM Capacity: 512,110,190,592 [512 GB] Unallocated NVM Capacity: 0 Controller ID: 0 NVMe Version: 1.4 Number of Namespaces: 1 Namespace 1 Size/Capacity: 512,110,190,592 [512 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 000000 ... Local Time is: Fri Aug 8 08:01:57 2025 MSK Firmware Updates (0x1a): 5 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x001f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Log Page Attributes (0x02): Cmd_Eff_Lg Maximum Data Transfer Size: 128 Pages Warning Comp. Temp. Threshold: 90 Celsius Critical Comp. Temp. Threshold: 95 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 6.50W - - 0 0 0 0 0 0 1 + 5.80W - - 1 1 1 1 0 0 2 + 3.60W - - 2 2 2 2 0 0 3 - 0.0500W - - 3 3 3 3 5000 10000 4 - 0.0480W - - 4 4 4 4 8000 45000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02, NSID 0xffffffff) Critical Warning: 0x00 Temperature: 40 Celsius Available Spare: 100% Available Spare Threshold: 1% Percentage Used: 0% Data Units Read: 397,799 [203 GB] Data Units Written: 437,883 [224 GB] Host Read Commands: 3,971,544 Host Write Commands: 6,619,707 Controller Busy Time: 4 Power Cycles: 54 Power On Hours: 54 Unsafe Shutdowns: 7 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 40 Celsius Temperature Sensor 2: 38 Celsius Error Information (NVMe Log 0x01, 16 of 64 entries) No Errors Logged Self-test Log (NVMe Log 0x06, NSID 0xffffffff) Self-test status: No self-test in progress No Self-tests Logged


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