Probe #75b181e2f3 of DEXP M14-I5W304
Log: smartctl
/dev/nvme0n1
smartctl 7.5 2025-04-30 r5714 [x86_64-linux-6.15.9-arch1-1] (local build)
Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Number: BIWIN NA80Y1M10-512G
Serial Number: --
Firmware Version: SN11795
PCI Vendor/Subsystem ID: 0x1e4b
IEEE OUI Identifier: 0x000000
Total NVM Capacity: 512,110,190,592 [512 GB]
Unallocated NVM Capacity: 0
Controller ID: 0
NVMe Version: 1.4
Number of Namespaces: 1
Namespace 1 Size/Capacity: 512,110,190,592 [512 GB]
Namespace 1 Formatted LBA Size: 512
Namespace 1 IEEE EUI-64: 000000 ...
Local Time is: Fri Aug 8 08:01:57 2025 MSK
Firmware Updates (0x1a): 5 Slots, no Reset required
Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test
Optional NVM Commands (0x001f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat
Log Page Attributes (0x02): Cmd_Eff_Lg
Maximum Data Transfer Size: 128 Pages
Warning Comp. Temp. Threshold: 90 Celsius
Critical Comp. Temp. Threshold: 95 Celsius
Supported Power States
St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat
0 + 6.50W - - 0 0 0 0 0 0
1 + 5.80W - - 1 1 1 1 0 0
2 + 3.60W - - 2 2 2 2 0 0
3 - 0.0500W - - 3 3 3 3 5000 10000
4 - 0.0480W - - 4 4 4 4 8000 45000
Supported LBA Sizes (NSID 0x1)
Id Fmt Data Metadt Rel_Perf
0 + 512 0 0
=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
SMART/Health Information (NVMe Log 0x02, NSID 0xffffffff)
Critical Warning: 0x00
Temperature: 40 Celsius
Available Spare: 100%
Available Spare Threshold: 1%
Percentage Used: 0%
Data Units Read: 397,799 [203 GB]
Data Units Written: 437,883 [224 GB]
Host Read Commands: 3,971,544
Host Write Commands: 6,619,707
Controller Busy Time: 4
Power Cycles: 54
Power On Hours: 54
Unsafe Shutdowns: 7
Media and Data Integrity Errors: 0
Error Information Log Entries: 0
Warning Comp. Temperature Time: 0
Critical Comp. Temperature Time: 0
Temperature Sensor 1: 40 Celsius
Temperature Sensor 2: 38 Celsius
Error Information (NVMe Log 0x01, 16 of 64 entries)
No Errors Logged
Self-test Log (NVMe Log 0x06, NSID 0xffffffff)
Self-test status: No self-test in progress
No Self-tests Logged