Probe #7f49fad2c7 of ASRock A300M-STX Desktop Computer

Log: smartctl

/dev/nvme0n1 smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.6.3-gentoo] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: Samsung SSD 970 EVO Plus 500GB Serial Number: -- Firmware Version: 2B2QEXM7 PCI Vendor/Subsystem ID: 0x144d IEEE OUI Identifier: 0x002538 Total NVM Capacity: 500,107,862,016 [500 GB] Unallocated NVM Capacity: 0 Controller ID: 4 NVMe Version: 1.3 Number of Namespaces: 1 Namespace 1 Size/Capacity: 500,107,862,016 [500 GB] Namespace 1 Utilization: 23,052,566,528 [23.0 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 002538 ... Local Time is: Fri Dec 1 17:13:07 2023 EST Firmware Updates (0x16): 3 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x005f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Log Page Attributes (0x03): S/H_per_NS Cmd_Eff_Lg Maximum Data Transfer Size: 512 Pages Warning Comp. Temp. Threshold: 85 Celsius Critical Comp. Temp. Threshold: 85 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 7.80W - - 0 0 0 0 0 0 1 + 6.00W - - 1 1 1 1 0 0 2 + 3.40W - - 2 2 2 2 0 0 3 - 0.0700W - - 3 3 3 3 210 1200 4 - 0.0100W - - 4 4 4 4 2000 8000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 35 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 0% Data Units Read: 2,721,314 [1.39 TB] Data Units Written: 4,747,234 [2.43 TB] Host Read Commands: 142,351,020 Host Write Commands: 19,283,951 Controller Busy Time: 124 Power Cycles: 1,002 Power On Hours: 193 Unsafe Shutdowns: 77 Media and Data Integrity Errors: 0 Error Information Log Entries: 831 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 35 Celsius Temperature Sensor 2: 47 Celsius Error Information (NVMe Log 0x01, 16 of 64 entries) Num ErrCount SQId CmdId Status PELoc LBA NSID VS Message 0 831 0 0x0004 0x4004 - 0 0 - Invalid Field in Command Self-test Log (NVMe Log 0x06) Self-test status: No self-test in progress No Self-tests Logged /dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.6.3-gentoo] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: TEAM T253E2512G Serial Number: -- Firmware Version: U0330A0 User Capacity: 512,110,190,592 bytes [512 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: Not in smartctl database 7.3/5533 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Dec 1 17:13:07 2023 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0 9 Power_On_Hours -O--CK 100 100 050 - 1130 12 Power_Cycle_Count -O--CK 100 100 050 - 542 160 Unknown_Attribute -O--CK 100 100 050 - 0 161 Unknown_Attribute PO--CK 100 100 050 - 100 163 Unknown_Attribute -O--CK 100 100 050 - 53 164 Unknown_Attribute -O--CK 100 100 050 - 1352 165 Unknown_Attribute -O--CK 100 100 050 - 2 166 Unknown_Attribute -O--CK 100 100 050 - 0 167 Unknown_Attribute -O--CK 100 100 050 - 0 168 Unknown_Attribute -O--CK 100 100 050 - 5050 169 Unknown_Attribute -O--CK 100 100 050 - 100 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0 177 Wear_Leveling_Count -O--CK 100 100 050 - 0 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 050 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0 192 Power-Off_Retract_Count -O--CK 100 100 050 - 37 194 Temperature_Celsius -O---K 100 100 050 - 0 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0 196 Reallocated_Event_Count -O--CK 100 100 050 - 0 197 Current_Pending_Sector -O--CK 100 100 050 - 0 198 Offline_Uncorrectable -O--CK 100 100 050 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0 232 Available_Reservd_Space -O--CK 100 100 050 - 100 241 Total_LBAs_Written ----CK 100 100 050 - 3793 242 Total_LBAs_Read ----CK 100 100 050 - 7529 245 Unknown_Attribute -O--CK 100 100 050 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 542 --- Lifetime Power-On Resets 0x01 0x010 4 1130 --- Power-on Hours 0x01 0x018 6 248616281 --- Logical Sectors Written 0x01 0x020 6 2547 --- Number of Write Commands 0x01 0x028 6 493425889 --- Logical Sectors Read 0x01 0x030 6 10225 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 8 Device-to-host register FISes sent due to a COMRESET


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