/dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.6.10-arch1-1] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Crucial/Micron Client SSDs Device Model: CT480BX500SSD1 Serial Number: -- LU WWN Device Id: 5 00a075 ... Firmware Version: M6CR056 User Capacity: 480,103,981,056 bytes [480 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5528 ATA Version is: ACS-3 T13/2161-D revision 4 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Jan 10 17:23:23 2024 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0 5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 349 12 Power_Cycle_Count -O--CK 100 100 000 - 94 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Ave_Block-Erase_Count -O--CK 100 100 000 - 4 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 14 180 Unused_Reserve_NAND_Blk PO--CK 100 100 000 - 45 183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0 184 Error_Correction_Count -O--CK 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 074 067 000 - 26 (Min/Max 18/33) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_ECC_Cnt -O--CK 100 100 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 202 Percent_Lifetime_Remain ----CK 100 100 001 - 0 206 Write_Error_Rate -OSR-- 100 100 000 - 0 210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0 246 Total_LBAs_Written -O--CK 100 100 000 - 1156777726 247 Host_Program_Page_Count -O--CK 100 100 000 - 36149303 248 FTL_Program_Page_Count -O--CK 100 100 000 - 18720768 249 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 0 251 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 813357558 252 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 253 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 254 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 223 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 88 Current Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 1 R_ERR response for non-data FIS 0x000a 4 2 Device-to-host register FISes sent due to a COMRESET /dev/sdb smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.6.10-arch1-1] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 860 EVO 500GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: RVT04B6Q User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5528 ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Wed Jan 10 17:23:24 2024 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 099 099 000 - 4133 12 Power_Cycle_Count -O--CK 099 099 000 - 795 177 Wear_Leveling_Count PO--C- 098 098 000 - 23 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 079 061 000 - 21 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 099 099 000 - 91 235 POR_Recovery_Count -O--C- 099 099 000 - 49 241 Total_LBAs_Written -O--CK 099 099 000 - 15667732580 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 21 Celsius Power Cycle Min/Max Temperature: 20/40 Celsius Lifetime Min/Max Temperature: 16/40 Celsius Specified Max Operating Temperature: 70 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (32) Index Estimated Time Temperature Celsius 33 2024-01-09 20:10 20 * ... ..( 4 skipped). .. * 38 2024-01-09 21:00 20 * 39 2024-01-09 21:10 21 ** 40 2024-01-09 21:20 20 * 41 2024-01-09 21:30 21 ** 42 2024-01-09 21:40 21 ** 43 2024-01-09 21:50 ? - 44 2024-01-09 22:00 18 - 45 2024-01-09 22:10 29 ********** 46 2024-01-09 22:20 30 *********** 47 2024-01-09 22:30 30 *********** 48 2024-01-09 22:40 30 *********** 49 2024-01-09 22:50 ? - 50 2024-01-09 23:00 18 - 51 2024-01-09 23:10 17 - ... ..( 2 skipped). .. - 54 2024-01-09 23:40 17 - 55 2024-01-09 23:50 18 - 56 2024-01-10 00:00 19 - 57 2024-01-10 00:10 19 - 58 2024-01-10 00:20 20 * ... ..( 7 skipped). .. * 66 2024-01-10 01:40 20 * 67 2024-01-10 01:50 21 ** ... ..( 2 skipped). .. ** 70 2024-01-10 02:20 21 ** 71 2024-01-10 02:30 20 * ... ..( 11 skipped). .. * 83 2024-01-10 04:30 20 * 84 2024-01-10 04:40 21 ** ... ..( 27 skipped). .. ** 112 2024-01-10 09:20 21 ** 113 2024-01-10 09:30 ? - 114 2024-01-10 09:40 18 - 115 2024-01-10 09:50 19 - 116 2024-01-10 10:00 19 - 117 2024-01-10 10:10 20 * 118 2024-01-10 10:20 20 * 119 2024-01-10 10:30 19 - 120 2024-01-10 10:40 19 - 121 2024-01-10 10:50 20 * 122 2024-01-10 11:00 19 - 123 2024-01-10 11:10 20 * ... ..( 3 skipped). .. * 127 2024-01-10 11:50 20 * 0 2024-01-10 12:00 21 ** ... ..( 9 skipped). .. ** 10 2024-01-10 13:40 21 ** 11 2024-01-10 13:50 ? - 12 2024-01-10 14:00 21 ** ... ..( 16 skipped). .. ** 29 2024-01-10 16:50 21 ** 30 2024-01-10 17:00 20 * 31 2024-01-10 17:10 21 ** 32 2024-01-10 17:20 21 ** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 795 --- Lifetime Power-On Resets 0x01 0x010 4 4133 --- Power-on Hours 0x01 0x018 6 15667732580 --- Logical Sectors Written 0x01 0x020 6 170522916 --- Number of Write Commands 0x01 0x028 6 13081216163 --- Logical Sectors Read 0x01 0x030 6 166445615 --- Number of Read Commands 0x01 0x038 6 2524000 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 81 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 21 --- Current Temperature 0x05 0x020 1 40 --- Highest Temperature 0x05 0x028 1 16 --- Lowest Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 4116 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 91 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 1 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC