/dev/sda === START OF INFORMATION SECTION === Model Family: Hitachi/HGST Travelstar Z5K500 Device Model: Hitachi HTS545050A7E380 Serial Number: -- LU WWN Device Id: 5 000cca ... Firmware Version: GG2OA7A0 User Capacity: 500,107,862,016 bytes [500 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Fri Oct 26 15:33:18 2018 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 45) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 113) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 062 - 0 2 Throughput_Performance P-S--K 100 100 040 - 0 3 Spin_Up_Time PO---K 214 100 033 - 1 4 Start_Stop_Count -O--CK 098 098 000 - 3896 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 7 Seek_Error_Rate POSR-K 100 100 067 - 0 8 Seek_Time_Performance P-S--K 100 100 040 - 0 9 Power_On_Hours -O--CK 092 092 000 - 3768 10 Spin_Retry_Count PO--CK 100 100 060 - 0 12 Power_Cycle_Count -O--CK 098 098 000 - 3805 183 Runtime_Bad_Block -O--CK 100 100 000 - 0 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 327680 188 Command_Timeout -O--CK 100 098 000 - 133146083363 190 Airflow_Temperature_Cel -O---K 065 053 045 - 35 (Min/Max 23/36) 191 G-Sense_Error_Rate -O--CK 083 083 000 - 4589 192 Power-Off_Retract_Count -O--CK 100 100 000 - 2031647 193 Load_Cycle_Count -O--CK 056 056 000 - 440168 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_Sector -O--CK 100 100 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -OS-CK 100 100 000 - 0 223 Load_Retry_Count -O-R-K 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 2337 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: 35 Celsius Power Cycle Min/Max Temperature: 23/36 Celsius Lifetime Min/Max Temperature: 10/47 Celsius Lifetime Average Temperature: 27 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -40/65 Celsius Temperature History Size (Index): 128 (108) Index Estimated Time Temperature Celsius 109 2018-10-26 13:26 36 ***************** ... ..( 3 skipped). .. ***************** 113 2018-10-26 13:30 36 ***************** 114 2018-10-26 13:31 35 **************** ... ..( 6 skipped). .. **************** 121 2018-10-26 13:38 35 **************** 122 2018-10-26 13:39 36 ***************** ... ..( 4 skipped). .. ***************** 127 2018-10-26 13:44 36 ***************** 0 2018-10-26 13:45 35 **************** ... ..(107 skipped). .. **************** 108 2018-10-26 15:33 35 **************** SCT Error Recovery Control: Read: 85 (8.5 seconds) Write: 85 (8.5 seconds) Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 10922 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS /dev/sdb === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG MZMPC032HBCD-000H1 Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: CXM12H1Q User Capacity: 32,017,047,552 bytes [32.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 2 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Oct 26 15:33:19 2018 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Unexpected SCT status 0x0001 (action_code=4, function_code=2) Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 180) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 3) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 099 099 000 - 3788 12 Power_Cycle_Count -O--CK 096 096 000 - 3804 170 Unused_Rsvd_Blk_Ct_Chip PO--C- 082 082 010 - 334 171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0 172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0 173 Wear_Leveling_Count PO--C- 088 088 017 - 407 174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 77 183 Runtime_Bad_Block -O--CK 100 100 001 - 0 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 188 Command_Timeout -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O---K 055 033 000 - 45 196 Reallocated_Event_Count -O---- 253 253 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 CRC_Error_Count -OSRCK 201 201 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 2 Comprehensive SMART error log 0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 2 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (2 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (2 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 2352 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) SCT Support Level: 1 Device State: Active (0) Current Temperature: 43 Celsius Power Cycle Min/Max Temperature: 25/45 Celsius Lifetime Min/Max Temperature: 0/70 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 15 minutes Temperature Logging Interval: 15 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (21) Index Estimated Time Temperature Celsius 22 2018-10-25 07:45 ? - ... ..(104 skipped). .. - 127 2018-10-26 10:00 ? - 0 2018-10-26 10:15 25 ****** 1 2018-10-26 10:30 43 ************************ 2 2018-10-26 10:45 45 ************************** 3 2018-10-26 11:00 44 ************************* 4 2018-10-26 11:15 43 ************************ 5 2018-10-26 11:30 42 *********************** 6 2018-10-26 11:45 42 *********************** 7 2018-10-26 12:00 43 ************************ 8 2018-10-26 12:15 43 ************************ 9 2018-10-26 12:30 44 ************************* 10 2018-10-26 12:45 44 ************************* 11 2018-10-26 13:00 45 ************************** 12 2018-10-26 13:15 44 ************************* 13 2018-10-26 13:30 43 ************************ ... ..( 5 skipped). .. ************************ 19 2018-10-26 15:00 43 ************************ 20 2018-10-26 15:15 44 ************************* 21 2018-10-26 15:30 43 ************************ SCT Error Recovery Control: Read: 57344 (5734.4 seconds) Write: 57344 (5734.4 seconds) Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 49152 R_ERR response for data FIS 0x0003 2 53248 R_ERR response for device-to-host data FIS 0x0004 2 57344 R_ERR response for host-to-device data FIS 0x0005 2 7952 R_ERR response for non-data FIS 0x0006 2 2562 R_ERR response for device-to-host non-data FIS 0x0007 2 4096 R_ERR response for host-to-device non-data FIS 0x0008 2 7952 Device-to-host non-data FIS retries 0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 12336 Device-to-host register FISes sent due to a COMRESET 0x000b 2 6145 CRC errors within host-to-device FIS 0x000d 2 7953 Non-CRC errors within host-to-device FIS 0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC 0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC