Probe #9c14f33700 of Dell 09M8Y8 A01 Desktop Computer (Precision T3610)

Log: smartctl

/dev/sda smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.12.22+bpo-amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 850 EVO 250GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EMT02B6Q User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun May 4 14:33:44 2025 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 133) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 099 099 000 - 4181 12 Power_Cycle_Count -O--CK 099 099 000 - 929 177 Wear_Leveling_Count PO--C- 099 099 000 - 9 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 074 063 000 - 26 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 15 241 Total_LBAs_Written -O--CK 099 099 000 - 4950306051 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 26 Celsius Power Cycle Min/Max Temperature: 26/29 Celsius Lifetime Min/Max Temperature: 23/40 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (115) Index Estimated Time Temperature Celsius 116 2025-05-03 17:20 28 ********* 117 2025-05-03 17:30 28 ********* 118 2025-05-03 17:40 ? - 119 2025-05-03 17:50 33 ************** 120 2025-05-03 18:00 28 ********* ... ..( 18 skipped). .. ********* 11 2025-05-03 21:10 28 ********* 12 2025-05-03 21:20 ? - 13 2025-05-03 21:30 33 ************** 14 2025-05-03 21:40 32 ************* 15 2025-05-03 21:50 34 *************** 16 2025-05-03 22:00 ? - 17 2025-05-03 22:10 29 ********** 18 2025-05-03 22:20 29 ********** 19 2025-05-03 22:30 32 ************* 20 2025-05-03 22:40 30 *********** 21 2025-05-03 22:50 30 *********** 22 2025-05-03 23:00 29 ********** ... ..( 5 skipped). .. ********** 28 2025-05-04 00:00 29 ********** 29 2025-05-04 00:10 30 *********** 30 2025-05-04 00:20 29 ********** 31 2025-05-04 00:30 30 *********** 32 2025-05-04 00:40 29 ********** 33 2025-05-04 00:50 30 *********** 34 2025-05-04 01:00 29 ********** 35 2025-05-04 01:10 29 ********** 36 2025-05-04 01:20 29 ********** 37 2025-05-04 01:30 34 *************** 38 2025-05-04 01:40 35 **************** 39 2025-05-04 01:50 31 ************ 40 2025-05-04 02:00 30 *********** 41 2025-05-04 02:10 29 ********** 42 2025-05-04 02:20 ? - 43 2025-05-04 02:30 28 ********* 44 2025-05-04 02:40 30 *********** 45 2025-05-04 02:50 34 *************** 46 2025-05-04 03:00 31 ************ 47 2025-05-04 03:10 31 ************ 48 2025-05-04 03:20 30 *********** 49 2025-05-04 03:30 ? - 50 2025-05-04 03:40 32 ************* 51 2025-05-04 03:50 33 ************** 52 2025-05-04 04:00 30 *********** 53 2025-05-04 04:10 31 ************ 54 2025-05-04 04:20 29 ********** 55 2025-05-04 04:30 30 *********** 56 2025-05-04 04:40 29 ********** 57 2025-05-04 04:50 29 ********** 58 2025-05-04 05:00 30 *********** 59 2025-05-04 05:10 30 *********** 60 2025-05-04 05:20 30 *********** 61 2025-05-04 05:30 29 ********** 62 2025-05-04 05:40 30 *********** 63 2025-05-04 05:50 29 ********** ... ..( 5 skipped). .. ********** 69 2025-05-04 06:50 29 ********** 70 2025-05-04 07:00 30 *********** 71 2025-05-04 07:10 29 ********** 72 2025-05-04 07:20 29 ********** 73 2025-05-04 07:30 29 ********** 74 2025-05-04 07:40 ? - 75 2025-05-04 07:50 29 ********** 76 2025-05-04 08:00 30 *********** 77 2025-05-04 08:10 29 ********** 78 2025-05-04 08:20 30 *********** 79 2025-05-04 08:30 29 ********** 80 2025-05-04 08:40 29 ********** 81 2025-05-04 08:50 ? - 82 2025-05-04 09:00 28 ********* 83 2025-05-04 09:10 27 ******** 84 2025-05-04 09:20 26 ******* ... ..( 10 skipped). .. ******* 95 2025-05-04 11:10 26 ******* 96 2025-05-04 11:20 28 ********* 97 2025-05-04 11:30 27 ******** 98 2025-05-04 11:40 27 ******** 99 2025-05-04 11:50 26 ******* ... ..( 15 skipped). .. ******* 115 2025-05-04 14:30 26 ******* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 3245 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 17 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/sdb smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.12.22+bpo-amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Marvell based SanDisk SSDs Device Model: SanDisk SSD PLUS 480 GB Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: UG3600RL User Capacity: 480,113,590,272 bytes [480 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun May 4 14:33:44 2025 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 32) The self-test routine was interrupted by the host with a hard or soft reset. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x15) SMART execute Offline immediate. No Auto Offline data collection support. Abort Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0 9 Power_On_Hours -O--CK 100 100 000 - 4135 12 Power_Cycle_Count -O--CK 100 100 000 - 912 165 Total_Write/Erase_Count -O--CK 100 100 000 - 919 166 Min_W/E_Cycle -O--CK 100 100 --- - 9 167 Min_Bad_Block/Die -O--CK 100 100 --- - 0 168 Maximum_Erase_Cycle -O--CK 100 100 --- - 24 169 Total_Bad_Block -O--CK 100 100 --- - 285 170 Unknown_Marvell_Attr -O--CK 100 100 --- - 0 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Avg_Write/Erase_Count -O--CK 100 100 000 - 9 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 38 184 End-to-End_Error -O--CK 100 100 --- - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 2 188 Command_Timeout -O--CK 100 100 --- - 0 194 Temperature_Celsius -O---K 080 074 000 - 20 (Min/Max 13/74) 199 SATA_CRC_Error -O--CK 100 100 --- - 0 230 Perc_Write/Erase_Count -O--CK 100 100 000 - 574 336 574 232 Perc_Avail_Resrvd_Space PO--CK 100 100 005 - 100 233 Total_NAND_Writes_GiB -O--CK 100 100 --- - 4442 234 Perc_Write/Erase_Ct_BC -O--CK 100 100 000 - 10346 241 Total_Writes_GiB ----CK 100 100 000 - 4461 242 Total_Reads_GiB ----CK 100 100 000 - 3859 244 Thermal_Throttle -O--CK 000 100 --- - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3 GPL,SL VS 1 Device vendor specific log 0xa7 GPL,SL VS 1 Device vendor specific log 0xa9 GPL,SL VS 3 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (16 sectors) Device Error Count: 2 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 [1] occurred at disk power-on lifetime: 3733 hours (155 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 00 00 00 00 00 00 00 00 00 Error: Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- b0 00 da 00 00 00 00 00 c2 4f 00 00 00 00:04:18.196 SMART RETURN STATUS 00 00 00 00 00 00 00 00 00 00 00 00 24 13d+06:08:44.612 NOP [Abort queued commands] 00 00 00 00 00 00 00 00 00 00 00 00 23 9d+22:36:33.459 NOP [Abort queued commands] 00 00 00 00 00 00 00 00 00 00 00 00 22 6d+15:04:22.306 NOP [Abort queued commands] 00 00 00 00 00 00 00 00 00 00 00 00 21 3d+07:32:11.153 NOP [Abort queued commands] Error 1 [0] occurred at disk power-on lifetime: 1437 hours (59 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 00 00 00 00 00 00 00 00 00 Error: Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- b0 00 da 00 00 00 00 00 c2 4f 00 00 00 00:00:52.675 SMART RETURN STATUS 00 00 00 00 00 00 00 00 00 00 00 00 14 13d+06:08:44.612 NOP [Abort queued commands] 00 00 00 00 00 00 00 00 00 00 00 00 13 9d+22:36:33.459 NOP [Abort queued commands] 00 00 00 00 00 00 00 00 00 00 00 00 12 6d+15:04:22.306 NOP [Abort queued commands] 00 00 00 00 00 00 00 00 00 00 00 00 11 3d+07:32:11.153 NOP [Abort queued commands] SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 912 --- Lifetime Power-On Resets 0x01 0x010 4 4135 --- Power-on Hours 0x01 0x018 6 9356994415 --- Logical Sectors Written 0x01 0x028 6 8093155564 --- Logical Sectors Read 0x01 0x038 6 4135 --- Date and Time TimeStamp 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 20 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 72 --- Highest Temperature 0x05 0x028 1 26 --- Lowest Temperature 0x05 0x030 1 33 --- Highest Average Short Term Temperature 0x05 0x038 1 33 --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 1 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 468 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 15 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error


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