/dev/sda
smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.12.22+bpo-amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT02B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun May 4 14:33:44 2025 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 4181
12 Power_Cycle_Count -O--CK 099 099 000 - 929
177 Wear_Leveling_Count PO--C- 099 099 000 - 9
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 063 000 - 26
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 15
241 Total_LBAs_Written -O--CK 099 099 000 - 4950306051
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 26 Celsius
Power Cycle Min/Max Temperature: 26/29 Celsius
Lifetime Min/Max Temperature: 23/40 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (115)
Index Estimated Time Temperature Celsius
116 2025-05-03 17:20 28 *********
117 2025-05-03 17:30 28 *********
118 2025-05-03 17:40 ? -
119 2025-05-03 17:50 33 **************
120 2025-05-03 18:00 28 *********
... ..( 18 skipped). .. *********
11 2025-05-03 21:10 28 *********
12 2025-05-03 21:20 ? -
13 2025-05-03 21:30 33 **************
14 2025-05-03 21:40 32 *************
15 2025-05-03 21:50 34 ***************
16 2025-05-03 22:00 ? -
17 2025-05-03 22:10 29 **********
18 2025-05-03 22:20 29 **********
19 2025-05-03 22:30 32 *************
20 2025-05-03 22:40 30 ***********
21 2025-05-03 22:50 30 ***********
22 2025-05-03 23:00 29 **********
... ..( 5 skipped). .. **********
28 2025-05-04 00:00 29 **********
29 2025-05-04 00:10 30 ***********
30 2025-05-04 00:20 29 **********
31 2025-05-04 00:30 30 ***********
32 2025-05-04 00:40 29 **********
33 2025-05-04 00:50 30 ***********
34 2025-05-04 01:00 29 **********
35 2025-05-04 01:10 29 **********
36 2025-05-04 01:20 29 **********
37 2025-05-04 01:30 34 ***************
38 2025-05-04 01:40 35 ****************
39 2025-05-04 01:50 31 ************
40 2025-05-04 02:00 30 ***********
41 2025-05-04 02:10 29 **********
42 2025-05-04 02:20 ? -
43 2025-05-04 02:30 28 *********
44 2025-05-04 02:40 30 ***********
45 2025-05-04 02:50 34 ***************
46 2025-05-04 03:00 31 ************
47 2025-05-04 03:10 31 ************
48 2025-05-04 03:20 30 ***********
49 2025-05-04 03:30 ? -
50 2025-05-04 03:40 32 *************
51 2025-05-04 03:50 33 **************
52 2025-05-04 04:00 30 ***********
53 2025-05-04 04:10 31 ************
54 2025-05-04 04:20 29 **********
55 2025-05-04 04:30 30 ***********
56 2025-05-04 04:40 29 **********
57 2025-05-04 04:50 29 **********
58 2025-05-04 05:00 30 ***********
59 2025-05-04 05:10 30 ***********
60 2025-05-04 05:20 30 ***********
61 2025-05-04 05:30 29 **********
62 2025-05-04 05:40 30 ***********
63 2025-05-04 05:50 29 **********
... ..( 5 skipped). .. **********
69 2025-05-04 06:50 29 **********
70 2025-05-04 07:00 30 ***********
71 2025-05-04 07:10 29 **********
72 2025-05-04 07:20 29 **********
73 2025-05-04 07:30 29 **********
74 2025-05-04 07:40 ? -
75 2025-05-04 07:50 29 **********
76 2025-05-04 08:00 30 ***********
77 2025-05-04 08:10 29 **********
78 2025-05-04 08:20 30 ***********
79 2025-05-04 08:30 29 **********
80 2025-05-04 08:40 29 **********
81 2025-05-04 08:50 ? -
82 2025-05-04 09:00 28 *********
83 2025-05-04 09:10 27 ********
84 2025-05-04 09:20 26 *******
... ..( 10 skipped). .. *******
95 2025-05-04 11:10 26 *******
96 2025-05-04 11:20 28 *********
97 2025-05-04 11:30 27 ********
98 2025-05-04 11:40 27 ********
99 2025-05-04 11:50 26 *******
... ..( 15 skipped). .. *******
115 2025-05-04 14:30 26 *******
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3245 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 17 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
/dev/sdb
smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.12.22+bpo-amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Marvell based SanDisk SSDs
Device Model: SanDisk SSD PLUS 480 GB
Serial Number: --
LU WWN Device Id: 5 001b44 ...
Firmware Version: UG3600RL
User Capacity: 480,113,590,272 bytes [480 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun May 4 14:33:44 2025 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 32) The self-test routine was interrupted
by the host with a hard or soft reset.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x15) SMART execute Offline immediate.
No Auto Offline data collection support.
Abort Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 100 100 000 - 4135
12 Power_Cycle_Count -O--CK 100 100 000 - 912
165 Total_Write/Erase_Count -O--CK 100 100 000 - 919
166 Min_W/E_Cycle -O--CK 100 100 --- - 9
167 Min_Bad_Block/Die -O--CK 100 100 --- - 0
168 Maximum_Erase_Cycle -O--CK 100 100 --- - 24
169 Total_Bad_Block -O--CK 100 100 --- - 285
170 Unknown_Marvell_Attr -O--CK 100 100 --- - 0
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 0
173 Avg_Write/Erase_Count -O--CK 100 100 000 - 9
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 38
184 End-to-End_Error -O--CK 100 100 --- - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 2
188 Command_Timeout -O--CK 100 100 --- - 0
194 Temperature_Celsius -O---K 080 074 000 - 20 (Min/Max 13/74)
199 SATA_CRC_Error -O--CK 100 100 --- - 0
230 Perc_Write/Erase_Count -O--CK 100 100 000 - 574 336 574
232 Perc_Avail_Resrvd_Space PO--CK 100 100 005 - 100
233 Total_NAND_Writes_GiB -O--CK 100 100 --- - 4442
234 Perc_Write/Erase_Ct_BC -O--CK 100 100 000 - 10346
241 Total_Writes_GiB ----CK 100 100 000 - 4461
242 Total_Reads_GiB ----CK 100 100 000 - 3859
244 Thermal_Throttle -O--CK 000 100 --- - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 16 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 1 Device vendor specific log
0xa2 GPL,SL VS 2 Device vendor specific log
0xa3 GPL,SL VS 1 Device vendor specific log
0xa7 GPL,SL VS 1 Device vendor specific log
0xa9 GPL,SL VS 3 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
Device Error Count: 2
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 [1] occurred at disk power-on lifetime: 3733 hours (155 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 00 00 00 00 00 00 00 00 00 Error:
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
b0 00 da 00 00 00 00 00 c2 4f 00 00 00 00:04:18.196 SMART RETURN STATUS
00 00 00 00 00 00 00 00 00 00 00 00 24 13d+06:08:44.612 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 00 00 00 00 23 9d+22:36:33.459 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 00 00 00 00 22 6d+15:04:22.306 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 00 00 00 00 21 3d+07:32:11.153 NOP [Abort queued commands]
Error 1 [0] occurred at disk power-on lifetime: 1437 hours (59 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 00 00 00 00 00 00 00 00 00 Error:
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
b0 00 da 00 00 00 00 00 c2 4f 00 00 00 00:00:52.675 SMART RETURN STATUS
00 00 00 00 00 00 00 00 00 00 00 00 14 13d+06:08:44.612 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 00 00 00 00 13 9d+22:36:33.459 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 00 00 00 00 12 6d+15:04:22.306 NOP [Abort queued commands]
00 00 00 00 00 00 00 00 00 00 00 00 11 3d+07:32:11.153 NOP [Abort queued commands]
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Selective Self-tests/Logging not supported
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 912 --- Lifetime Power-On Resets
0x01 0x010 4 4135 --- Power-on Hours
0x01 0x018 6 9356994415 --- Logical Sectors Written
0x01 0x028 6 8093155564 --- Logical Sectors Read
0x01 0x038 6 4135 --- Date and Time TimeStamp
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 20 --- Current Temperature
0x05 0x010 1 - --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 72 --- Highest Temperature
0x05 0x028 1 26 --- Lowest Temperature
0x05 0x030 1 33 --- Highest Average Short Term Temperature
0x05 0x038 1 33 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 95 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0009 2 468 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 15 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0001 2 0 Command failed due to ICRC error