/dev/nvme0n1 smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.2.0-4-cachyos-bore] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: Samsung SSD 970 EVO Plus 1TB Serial Number: -- Firmware Version: 4B2QEXM7 PCI Vendor/Subsystem ID: 0x144d IEEE OUI Identifier: 0x002538 Total NVM Capacity: 1,000,204,886,016 [1.00 TB] Unallocated NVM Capacity: 0 Controller ID: 6 NVMe Version: 1.3 Number of Namespaces: 1 Namespace 1 Size/Capacity: 1,000,204,886,016 [1.00 TB] Namespace 1 Utilization: 79,262,507,008 [79.2 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 002538 ... Local Time is: Thu Feb 23 13:05:41 2023 EST Firmware Updates (0x16): 3 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x0057): Comp Wr_Unc DS_Mngmt Sav/Sel_Feat Timestmp Log Page Attributes (0x0f): S/H_per_NS Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg Maximum Data Transfer Size: 128 Pages Warning Comp. Temp. Threshold: 82 Celsius Critical Comp. Temp. Threshold: 85 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 7.54W - - 0 0 0 0 0 0 1 + 7.54W - - 1 1 1 1 0 200 2 + 7.54W - - 2 2 2 2 0 1000 3 - 0.0500W - - 3 3 3 3 2000 1200 4 - 0.0050W - - 4 4 4 4 500 9500 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 42 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 0% Data Units Read: 5,164,536 [2.64 TB] Data Units Written: 5,628,954 [2.88 TB] Host Read Commands: 56,246,474 Host Write Commands: 81,140,488 Controller Busy Time: 565 Power Cycles: 586 Power On Hours: 1,049 Unsafe Shutdowns: 226 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 42 Celsius Temperature Sensor 2: 45 Celsius Error Information (NVMe Log 0x01, 16 of 64 entries) No Errors Logged /dev/sda smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.2.0-4-cachyos-bore] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Silicon Motion based OEM SSDs Device Model: SPCC M.2 SSD Serial Number: -- Firmware Version: S1211A0 User Capacity: 1,024,209,543,168 bytes [1.02 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu Feb 23 13:05:41 2023 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0 9 Power_On_Hours -O--CK 100 100 050 - 2685 12 Power_Cycle_Count -O--CK 100 100 050 - 233 160 Uncorrectable_Error_Cnt -O--CK 100 100 050 - 0 161 Valid_Spare_Block_Cnt PO--CK 100 100 050 - 100 163 Initial_Bad_Block_Count -O--CK 100 100 050 - 9 164 Total_Erase_Count -O--CK 100 100 050 - 6242 165 Max_Erase_Count -O--CK 100 100 050 - 47 166 Min_Erase_Count -O--CK 100 100 050 - 1 167 Average_Erase_Count -O--CK 100 100 050 - 12 168 Max_Erase_Count_of_Spec -O--CK 100 100 050 - 7000 169 Remaining_Lifetime_Perc -O--CK 100 100 050 - 100 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0 177 Wear_Leveling_Count -O--CK 100 100 050 - 0 178 Runtime_Invalid_Blk_Cnt -O--CK 100 100 050 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0 192 Power-Off_Retract_Count -O--CK 100 100 050 - 174 194 Temperature_Celsius -O---K 100 100 050 - 40 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 370 196 Reallocated_Event_Count -O--CK 100 100 050 - 0 197 Current_Pending_Sector -O--CK 100 100 050 - 0 198 Offline_Uncorrectable -O--CK 100 100 050 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 8 232 Available_Reservd_Space -O--CK 100 100 050 - 100 241 Host_Writes_32MiB ----CK 100 100 050 - 101450 242 Host_Reads_32MiB ----CK 100 100 050 - 74523 245 TLC_Writes_32MiB -O--CK 100 100 050 - 121853 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 33 (device log contains only the most recent 4 errors) CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 33 [0] log entry is empty Error 32 [3] log entry is empty Error 31 [2] log entry is empty Error 30 [1] occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 00 -- 00 00 00 00 00 00 00 00 00 00 00 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- b0 00 d1 01 01 00 00 4f 00 c2 01 00 08 00:00:00.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] 2f 00 00 01 01 00 00 00 00 00 03 00 08 00:00:00.000 READ LOG EXT 2f 00 00 01 01 00 00 00 00 00 00 00 08 00:00:00.000 READ LOG EXT b0 00 d5 01 01 00 00 4f 00 c2 00 00 08 00:00:00.000 SMART READ LOG b0 00 da 00 00 00 00 4f 00 c2 00 00 08 00:00:00.000 SMART RETURN STATUS SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 233 --- Lifetime Power-On Resets 0x01 0x010 4 2685 --- Power-on Hours 0x01 0x018 6 2353677803 --- Logical Sectors Written 0x01 0x020 6 59677 --- Number of Write Commands 0x01 0x028 6 588999619 --- Logical Sectors Read 0x01 0x030 6 169023 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 43 Device-to-host register FISes sent due to a COMRESET