/dev/nvme0n1 smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.15.0-46-generic] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: SAMSUNG MZVLQ512HBLU-00BH1 Serial Number: -- Firmware Version: HPS1NFAV PCI Vendor/Subsystem ID: 0x144d IEEE OUI Identifier: 0x002538 Total NVM Capacity: 512,110,190,592 [512 GB] Unallocated NVM Capacity: 0 Controller ID: 5 Number of Namespaces: 1 Namespace 1 Size/Capacity: 512,110,190,592 [512 GB] Namespace 1 Utilization: 20,657,745,920 [20.6 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 002538 ... Local Time is: Fri Oct 21 16:07:45 2022 NZDT Firmware Updates (0x16): 3 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x005f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Maximum Data Transfer Size: 512 Pages Warning Comp. Temp. Threshold: 81 Celsius Critical Comp. Temp. Threshold: 85 Celsius Namespace 1 Features (0x10): *Other* Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 5.36W - - 0 0 0 0 0 0 1 + 4.47W - - 1 1 1 1 0 0 2 + 2.23W - - 2 2 2 2 0 500 3 - 0.0500W - - 3 3 3 3 210 1200 4 - 0.0050W - - 4 4 4 4 1000 9000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 1 - 4096 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 28 Celsius Available Spare: 100% Available Spare Threshold: 5% Percentage Used: 0% Data Units Read: 608,441 [311 GB] Data Units Written: 321,963 [164 GB] Host Read Commands: 2,265,652 Host Write Commands: 2,269,629 Controller Busy Time: 7 Power Cycles: 55 Power On Hours: 2 Unsafe Shutdowns: 29 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 28 Celsius Error Information (NVMe Log 0x01, max 64 entries) No Errors Logged