/dev/sda smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-kaisen1-amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG MZMPA024HMCD-000L1 Serial Number: -- Firmware Version: AXM22L1Q User Capacity: 24,015,495,168 bytes [24.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 1 SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Nov 28 22:45:02 2021 PST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 2) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 9 Power_On_Hours -O--CK 099 099 --- - 1951 12 Power_Cycle_Count -O--CK 098 098 --- - 1543 175 Program_Fail_Count_Chip -O--CK 100 100 --- - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 --- - 0 177 Wear_Leveling_Count PO--C- 099 099 --- - 16 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 083 083 --- - 62 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 085 085 --- - 108 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 085 085 --- - 648 181 Program_Fail_Cnt_Total -O--CK 100 100 --- - 0 182 Erase_Fail_Count_Total -O--CK 100 100 --- - 0 183 Runtime_Bad_Block PO--C- 100 100 --- - 0 187 Reported_Uncorrect -O--CK 100 100 --- - 0 190 Airflow_Temperature_Cel -O---K 074 057 --- - 26 195 Hardware_ECC_Recovered -O-RC- 200 200 --- - 0 198 Offline_Uncorrectable ----CK 100 100 --- - 0 199 UDMA_CRC_Error_Count -OSRCK 253 253 --- - 0 233 Media_Wearout_Indicator -O-RCK 199 199 --- - 5 234 Unknown_Attribute -O--C- 100 100 --- - 0 235 Unknown_Attribute -O--C- 099 099 --- - 48 236 Unknown_Attribute -O--C- 099 099 --- - 34 237 Unknown_Attribute -O--C- 099 099 --- - 176 238 Unknown_Attribute -O--C- 099 099 --- - 108 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 0 Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 1 Comprehensive SMART error log 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 1 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum. SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 87 - # 2 Short offline Completed without error 00% 5 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 27350 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC