/dev/sda === START OF INFORMATION SECTION === Model Family: Western Digital Caviar Device Model: WDC WD800BB-00FRA0 Serial Number: -- Firmware Version: 77.07W77 User Capacity: 80,026,361,856 bytes [80.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 (minor revision not indicated) Local Time is: Wed Jan 6 23:07:31 2021 +08 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 2361) seconds. Offline data collection capabilities: (0x79) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 37) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 200 200 051 - 0 3 Spin_Up_Time POS--- 083 081 021 - 2358 4 Start_Stop_Count -O--CK 096 096 040 - 4121 5 Reallocated_Sector_Ct PO--CK 199 199 140 - 1 7 Seek_Error_Rate PO-R-- 100 253 051 - 0 9 Power_On_Hours -O--CK 083 083 000 - 12663 10 Spin_Retry_Count PO--C- 100 096 051 - 0 11 Calibration_Retry_Count PO--C- 100 100 051 - 0 12 Power_Cycle_Count -O--CK 097 097 000 - 3855 194 Temperature_Celsius -O---K 108 253 000 - 35 196 Reallocated_Event_Count -O--CK 199 199 000 - 1 197 Current_Pending_Sector -O--C- 200 200 000 - 0 198 Offline_Uncorrectable -O--C- 200 200 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 253 000 - 6 200 Multi_Zone_Error_Rate P--R-- 200 085 051 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning Read SMART Log Directory failed: scsi error badly formed scsi parameters General Purpose Log Directory not supported SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 779 hours (32 days + 11 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 f8 3b 5f f0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 01 00 c8 00 00 08 00 00 00:01:21.950 [RESERVED] 00 00 5f 00 00 ef 3b 00 00:01:21.950 NOP [Abort queued commands] 01 00 c8 00 00 08 00 00 00:01:21.950 [RESERVED] 00 00 5f 00 00 d7 3b 00 00:01:21.950 NOP [Abort queued commands] 01 00 c8 00 00 08 00 00 00:01:21.950 [RESERVED] Error 1 occurred at disk power-on lifetime: 779 hours (32 days + 11 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 f8 3b 5f f0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 01 00 c8 00 00 08 00 00 00:01:19.950 [RESERVED] 00 00 5f 00 00 e7 3b 00 00:01:19.950 NOP [Abort queued commands] 01 00 c8 00 00 08 00 00 00:01:19.950 [RESERVED] 01 00 c8 00 00 08 00 00 00:01:19.950 [RESERVED] 00 00 5f 00 00 bf 3b 00 00:01:19.950 NOP [Abort queued commands] SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported /dev/sdb === START OF INFORMATION SECTION === Model Family: Seagate UX Device Model: ST320014A Serial Number: -- Firmware Version: 3.07 User Capacity: 20,020,396,032 bytes [20.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 (minor revision not indicated) Local Time is: Wed Jan 6 23:07:31 2021 +08 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM level is: 128 (quiet), recommended: 128 APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 420) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 20) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 089 061 025 - 697 3 Spin_Up_Time PO---- 098 097 000 - 0 4 Start_Stop_Count -O--CK 099 099 020 - 1114 5 Reallocated_Sector_Ct PO--CK 100 100 036 - 0 7 Seek_Error_Rate POSR-- 084 060 030 - 333353992 9 Power_On_Hours -O--CK 083 083 000 - 15043 10 Spin_Retry_Count -O--C- 100 100 000 - 0 12 Power_Cycle_Count -O--CK 096 096 020 - 4979 194 Temperature_Celsius -O---K 031 047 000 - 31 195 Hardware_ECC_Recovered -O-RC- 100 253 000 - 0 197 Current_Pending_Sector -O--C- 100 100 000 - 0 198 Offline_Uncorrectable ----C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 1 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x09 SL R/W 1 Selective self-test log 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 47 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 47 occurred at disk power-on lifetime: 14961 hours (623 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 03 4b 8c 38 f0 Error: UNC 3 sectors at LBA = 0x00388c4b = 3705931 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 10 3f 8c 38 f0 00 00:00:13.373 READ DMA ca 00 c0 57 f9 87 f1 00 00:00:02.958 WRITE DMA ca 00 00 57 f8 87 f1 00 00:00:07.710 WRITE DMA ca 00 00 57 f7 87 f1 00 00:00:02.356 WRITE DMA ca 00 00 57 f6 87 f1 00 00:00:02.383 WRITE DMA Error 46 occurred at disk power-on lifetime: 14961 hours (623 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 03 4b 8c 38 f0 Error: UNC 3 sectors at LBA = 0x00388c4b = 3705931 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 10 3f 8c 38 f0 00 00:00:12.070 READ DMA ca 00 c0 2f 15 8b f1 00 00:00:02.257 WRITE DMA ca 00 00 2f 14 8b f1 00 00:00:04.403 WRITE DMA ca 00 00 2f 13 8b f1 00 00:00:02.353 WRITE DMA ca 00 00 2f 12 8b f1 00 00:00:02.357 WRITE DMA Error 45 occurred at disk power-on lifetime: 14961 hours (623 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 03 4b 8c 38 f0 Error: UNC 3 sectors at LBA = 0x00388c4b = 3705931 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 10 3f 8c 38 f0 00 00:00:12.143 READ DMA ca 00 c0 bf 9a 9e f1 00 00:00:03.688 WRITE DMA ca 00 00 bf 99 9e f1 00 00:00:13.250 WRITE DMA ca 00 00 bf 98 9e f1 00 00:00:02.351 WRITE DMA ca 00 00 bf 97 9e f1 00 00:00:02.358 WRITE DMA Error 44 occurred at disk power-on lifetime: 14960 hours (623 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 03 4b 8c 38 f0 Error: UNC 3 sectors at LBA = 0x00388c4b = 3705931 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 10 3f 8c 38 f0 00 00:00:13.644 READ DMA ca 00 c0 ff c5 9d f1 00 00:00:05.183 WRITE DMA ca 00 00 ff c4 9d f1 00 00:00:08.353 WRITE DMA ca 00 00 ff c3 9d f1 00 00:00:02.386 WRITE DMA ca 00 00 ff c2 9d f1 00 00:00:02.378 WRITE DMA Error 43 occurred at disk power-on lifetime: 14960 hours (623 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 03 4b 8c 38 f0 Error: UNC 3 sectors at LBA = 0x00388c4b = 3705931 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 10 3f 8c 38 f0 00 00:00:07.052 READ DMA ca 00 c0 f7 c7 af f0 00 00:00:01.760 WRITE DMA ca 00 00 f7 c6 af f0 00 00:00:02.342 WRITE DMA ca 00 00 f7 c5 af f0 00 00:00:16.645 WRITE DMA ca 00 00 f7 c4 af f0 00 00:00:02.354 WRITE DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported