Probe #fba507d764 of Sony VGN-CR31SR_P

Log: smartctl

/dev/sda === START OF INFORMATION SECTION === Model Family: Seagate Momentus 5400.3 Device Model: ST9160821AS Serial Number: -- Firmware Version: 3.ALC User Capacity: 160 041 885 696 bytes [160 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-7 (minor revision not indicated) Local Time is: Sat May 20 01:23:29 2017 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 426) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 111) minutes. SCT capabilities: (0x0001) SCT Status supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 100 253 006 - 0 3 Spin_Up_Time PO---- 099 099 000 - 0 4 Start_Stop_Count -O--CK 093 093 020 - 7448 5 Reallocated_Sector_Ct PO--CK 100 100 036 - 7 7 Seek_Error_Rate POSR-- 087 060 030 - 511473344 9 Power_On_Hours -O--CK 095 095 000 - 5180 10 Spin_Retry_Count PO--C- 100 100 034 - 0 12 Power_Cycle_Count -O--CK 093 093 020 - 7546 187 Reported_Uncorrect -O--CK 044 044 000 - 56 189 High_Fly_Writes -O-RCK 098 098 000 - 2 190 Airflow_Temperature_Cel -O---K 059 043 045 Past 41 (Min/Max 40/41) 192 Power-Off_Retract_Count -O--CK 100 100 000 - 1741 193 Load_Cycle_Count -O--CK 055 055 000 - 90845 194 Temperature_Celsius -O---K 041 057 000 - 41 (0 18 0 0 0) 195 Hardware_ECC_Recovered -O-RC- 079 062 000 - 189790501 197 Current_Pending_Sector -O--C- 100 100 000 - 0 198 Offline_Uncorrectable ----C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 SL R/O 5 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 SL R/O 1 SATA NCQ Queued Error log 0x11 SL R/O 1 SATA Phy Event Counters log 0x20 SL R/O 1 Streaming performance log [OBS-8] 0x21 SL R/O 1 Write stream error log 0x22 SL R/O 1 Read stream error log 0x23 SL R/O 1 Delayed sector log [OBS-8] 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log 0xe0 SL R/W 1 SCT Command/Status 0xe1 SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 56 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 56 occurred at disk power-on lifetime: 5169 hours (215 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 44 63 fe e0 Error: UNC at LBA = 0x00fe6344 = 16671556 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 40 63 fe e0 00 00:42:59.979 READ DMA EXT 25 00 08 38 63 fe e0 00 00:42:59.979 READ DMA EXT 25 00 08 30 63 fe e0 00 00:42:59.979 READ DMA EXT 25 00 08 28 63 fe e0 00 00:42:59.978 READ DMA EXT 25 00 08 20 63 fe e0 00 00:42:59.978 READ DMA EXT Error 55 occurred at disk power-on lifetime: 5169 hours (215 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 44 63 fe e0 Error: UNC at LBA = 0x00fe6344 = 16671556 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 80 e0 62 fe e0 00 00:42:57.076 READ DMA EXT 25 00 80 60 62 fe e0 00 00:42:57.075 READ DMA EXT 25 00 80 e0 61 fe e0 00 00:42:57.073 READ DMA EXT 25 00 80 60 61 fe e0 00 00:42:57.071 READ DMA EXT 25 00 80 e0 60 fe e0 00 00:42:57.069 READ DMA EXT Error 54 occurred at disk power-on lifetime: 5169 hours (215 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 9c 9d 02 e0 Error: UNC at LBA = 0x00029d9c = 171420 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 98 9d 02 e0 00 00:42:43.162 READ DMA EXT 25 00 08 90 9d 02 e0 00 00:42:43.160 READ DMA EXT 25 00 08 88 9d 02 e0 00 00:42:43.158 READ DMA EXT 25 00 08 80 9d 02 e0 00 00:42:46.064 READ DMA EXT 25 00 08 78 9d 02 e0 00 00:42:46.064 READ DMA EXT Error 53 occurred at disk power-on lifetime: 5169 hours (215 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 9c 9d 02 e0 Error: UNC at LBA = 0x00029d9c = 171420 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 80 60 9d 02 e0 00 00:42:43.162 READ DMA EXT 25 00 80 e0 9c 02 e0 00 00:42:43.160 READ DMA EXT 25 00 80 60 9c 02 e0 00 00:42:43.158 READ DMA EXT 25 00 80 e0 9b 02 e0 00 00:42:43.157 READ DMA EXT 25 00 80 60 9b 02 e0 00 00:42:43.155 READ DMA EXT Error 52 occurred at disk power-on lifetime: 1975 hours (82 days + 7 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 89 a5 ec e0 Error: UNC at LBA = 0x00eca589 = 15508873 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 88 a5 ec e0 00 01:02:45.472 READ DMA EXT 25 00 08 80 a5 ec e0 00 01:02:45.471 READ DMA EXT 35 00 20 60 73 f4 e0 00 01:02:45.471 WRITE DMA EXT 25 00 a0 00 6c 85 e0 00 01:02:45.449 READ DMA EXT 25 00 4a 10 06 29 e0 00 01:02:45.448 READ DMA EXT SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 521 (0x0209) SCT Support Level: 1 Device State: Active (0) Current Temperature: 41 Celsius Power Cycle Max Temperature: 0 Celsius Lifetime Max Temperature: 0 Celsius SCT Data Table command not supported SCT Error Recovery Control command not supported Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x000a 2 1 Device-to-host register FISes sent due to a COMRESET 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x8002 2 0 Vendor specific 0x8003 2 0 Vendor specific 0x8004 2 0 Vendor specific


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