/dev/sda,megaraid_disk_00 smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-8-pve] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: TOSHIBA KHK6XLSE1T92 Serial Number: -- LU WWN Device Id: 5 8ce38e ... Firmware Version: 1DEEE103 User Capacity: 1,920,383,410,176 bytes [1.92 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database 7.3/5319 ATA Version is: ACS-3 (minor revision not indicated) SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Jun 11 14:21:57 2025 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART Status not supported: ATA return descriptor not supported by controller firmware SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 1) minutes. SCT capabilities: (0x0001) SCT Status supported. SMART Attributes Data Structure revision number: 4258 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--C- 100 100 010 - 0 9 Power_On_Hours -O--C- 100 100 000 - 34876 12 Power_Cycle_Count -O--CK 100 100 000 - 21 173 Unknown_Attribute -O--C- 192 192 000 - 8 175 Program_Fail_Count_Chip PO--CK 100 100 099 - 6339371728896 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0 183 Runtime_Bad_Block -O--CK 100 100 000 - 0 184 End-to-End_Error PO--CK 100 100 090 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O---K 073 063 000 - 27 (Min/Max 15/37) 192 Power-Off_Retract_Count -O--CK 100 100 000 - 16 194 Temperature_Celsius -O---K 070 060 000 - 30 (Min/Max 18/40) 197 Current_Pending_Sector -O--C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 100 100 000 - 0 234 Unknown_Attribute -O--CK 100 100 000 - 512 241 Total_LBAs_Written -O--CK 100 100 000 - 13481543 242 Total_LBAs_Read -O--CK 100 100 000 - 67509351 249 Unknown_Attribute -O--CK 100 100 000 - 1239461 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 64 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 16 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x24 GPL R/O 8191 Current Device Internal Status Data log 0x25 GPL R/O 1 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (64 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (16 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 32476 - # 2 Short offline Completed without error 00% 32472 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 3 (0x0003) Device State: Active (0) Current Temperature: 30 Celsius Power Cycle Min/Max Temperature: 22/40 Celsius Lifetime Min/Max Temperature: 18/40 Celsius Under/Over Temperature Limit Count: 0/0 Vendor specific: 00 00 03 00 01 01 00 05 05 00 00 00 00 00 00 00 00 00 00 00 63 cc 7b 07 1c 00 00 00 00 00 00 10 SCT Data Table command not supported SCT Error Recovery Control command not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 21 --- Lifetime Power-On Resets 0x01 0x010 4 34875 --- Power-on Hours 0x01 0x018 6 883526408471 --- Logical Sectors Written 0x01 0x020 6 3749483065 --- Number of Write Commands 0x01 0x028 6 4424292867667 --- Logical Sectors Read 0x01 0x030 6 289261331254 --- Number of Read Commands 0x01 0x038 6 125553118000 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 30 --- Current Temperature 0x05 0x010 1 29 --- Average Short Term Temperature 0x05 0x018 1 29 --- Average Long Term Temperature 0x05 0x020 1 40 --- Highest Temperature 0x05 0x028 1 18 --- Lowest Temperature 0x05 0x030 1 38 --- Highest Average Short Term Temperature 0x05 0x038 1 24 --- Lowest Average Short Term Temperature 0x05 0x040 1 34 --- Highest Average Long Term Temperature 0x05 0x048 1 34 --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 10 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 8 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 8 0 Command failed due to ICRC error 0x0002 8 0 R_ERR response for data FIS 0x0003 8 0 R_ERR response for device-to-host data FIS 0x0004 8 0 R_ERR response for host-to-device data FIS 0x0005 8 0 R_ERR response for non-data FIS 0x0006 8 0 R_ERR response for device-to-host non-data FIS 0x0007 8 0 R_ERR response for host-to-device non-data FIS 0x000a 8 10 Device-to-host register FISes sent due to a COMRESET 0x000b 8 0 CRC errors within host-to-device FIS 0x000d 8 0 Non-CRC errors within host-to-device FIS